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Number of items: 99.

Auernhammer, Julia ; Keil, Tom ; Lin, Binbin ; Schäfer, Jan-Lukas ; Xu, Bai-Xiang ; Biesalski, Markus ; Stark, R. W. (2021):
Mapping humidity-dependent mechanical properties of a single cellulose fibre.
In: Cellulose, ISSN 0969-0239,
DOI: 10.1007/s10570-021-04058-4,
[Article]

Acosta, Matias ; Detsch, Rainer ; Grünewald, Alina ; Rojas, Virginia ; Schultheiß, Jan ; Wajda, Aleksandra ; Stark, R. W. ; Narayan, Suman ; Sitarz, Maciej ; Koruza, Jurij ; Boccaccini, Aldo R. (2018):
Cytotoxicity, chemical stability, and surface properties of ferroelectric ceramics for biomaterials.
In: Journal of the American Ceramic Society, 110, pp. 440-449. The American Ceramic Society, ISSN 00027820,
DOI: 10.1111/jace.15193,
[Article]

Peter, D. ; Dalmer, M. ; Lechner, A. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2012):
The influence of liquid media on the fracture strength of polysilicon nanostructures.
In: Diffusion and Defect Data Part B (Solid State Phenomena), 187, pp. 127-30. [Article]

Peter, D. ; Dalmer, M. ; Lechner, A. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2011):
Maesurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse.
In: J. Micromech. Microeng., 21, pp. 025001. [Article]

Gorbushina, A. A. ; Kempe, A. ; Rodenacker, K. ; Jütting, U. ; Altermann, W. ; Stark, R. W. ; Heckl, W. M. ; Krumbein, W. E. (2011):
Quantitative 3-dimensional Image Analysis of Mineral Surface Modifications - Chemical, Mechanical and Biological.
In: Geomicrobiology J., 28 (2), pp. 172 - 184. [Article]

Wei, T. D. ; Gong, J. ; Rössle, S. C. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. (2011):
A leucine-rich repeat assemply approach for homology modeling of the human TLR5-10 and mouse TLR 11-13 ectodomains.
In: J. Mol. Model., 17, pp. 27-36. [Article]

Janko, M. ; Davydovskaya, P. ; Bauer, M. ; Zink, A. ; Stark, R. W. (2010):
Anisotropic Raman scattering in collagen bundles.
In: OPTICS LETTERS, 35 (16), pp. 2765-2767. [Article]

Stark, R. W.
Sattler, K. (ed.) (2010):
Nanomanipulation and nanorobotics with the atomic force microscope.
7, In: Handbook of Nanophysics, pp. 43.1-43.14, Boca Raton, CRC Press, [Book Section]

Stark, R. W. ; Stark, M.
Sattler, K. (ed.) (2010):
Quantitative dynamic atomic force microscopy.
1, In: Handbook of Nanophysics, pp. 33.1-33.16, Boca Raton, CRC Press, [Book Section]

Baumann, M. ; Stark, R. W. (2010):
Dual frequency atomic force microscopy on charged surfaces.
In: Ultramicroscopy, 110, pp. 578-581. [Article]

Wei, T. ; Gong, J. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. ; Rössle, S. C. (2010):
Homology modeling of human Toll-like receptors TLR7, 8, and 9 ligand-binding domains.
In: Protein Science, 18 (8), pp. 1684-1691. Wiley, ISSN 1469-896X,
DOI: 10.1002/pro.186,
[Article]

Lübbe, M. ; Gigler, A. M. ; Stark, R. W. ; Moritz, W. (2010):
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surface Science, 604 (7-8), pp. 679-685. Elsevier, ISSN 0039-6028,
DOI: 10.1016/j.susc.2010.01.015,
[Article]

Stark, R. W. (2010):
Bistability, higher harmonics and chaos in AFM.
In: Materials Today, 13, pp. 24-32. [Article]

Gong, J. ; Wei, T. D. ; Stark, R. W. ; Jamitzky, F. ; Heckl, W. M. ; Anders, H. J. ; Lech, M. ; Rössle, S. C. (2010):
Inhibition of the Toll-like receptors TLR4 and 7 signaling pathways by SIGIRR – a computational approach.
In: Journal of structural biology, 169 (3), pp. 323-330. Elsevier, ISSN 1095-8657,
DOI: 10.1016/j.jsb.2009.12.007,
[Article]

Jamitzky, F. ; Stark, R. W. (2010):
Intermittency in amplitude modulated dynamic atomic force microscopy.
In: Ultramicroscopy, 110, pp. 578-581. [Article]

Lech, M. ; Skuginna, V. ; Kulkarni, O. P. ; Gong, J. ; Wei, T. ; Stark, R. W. ; Garlanda, C. ; Mantovani, A. ; Anders, H. J. (2010):
Lack of SIGIRR/TIR8 aggravates hydrocarbon oil-induced systemic lupus nephritis.
In: The Journal of Pathology, 220 (5), pp. 596 - 607. Wiley, e-ISSN 1096-9896,
DOI: 10.1002/path.2678,
[Article]

Janko, M. ; Zink, A. ; Gigler, A. M. ; Heckl, W. M. ; Stark, R. W. (2010):
Nanostructure and mechanics of mummified type I collagen from the 5300-year-old Tyrolean Iceman.
In: Proc. Roy. Soc. B, 277, pp. 2301-2309. [Article]

Walther, F. ; Drobek, T. ; Gigler, A. M. ; Hennemeyer, M. ; Kaiser, M. ; Herberg, H. ; Shimitsu, T. ; Morfill, G. E. ; Stark, R. W. (2010):
Surface hydrophilisation of SU-8 by plasma and wet chemical processes.
In: Surf. Interf. Anal, 42, pp. 1735-1744. [Article]

Gong, J. ; Wei, T. D. ; Zhang, N. ; Jamitzky, F. ; Heckl, W. M. ; Rössle, S. C. ; Stark, R. W. (2010):
TollML: a database of toll-like receptor structural motifs.
In: J. Mol. Model, 16, pp. 1283-1289. [Article]

Pompl, R. ; Jamitzky, F. ; Shimizu, T. ; Steffes, B. ; Bunk, W. ; Schmidt, H. ; Georgi, M. ; Ramrath, K. ; Stolz, W. ; Stark, R. W. ; Urayama, T. ; Fujii, S. ; Morfill, G. (2009):
Effect of low-temperature plasma on bacteria observed by repeated AFM-imaging.
In: New Journal of Physics, 11, p. 115023. Institute of Physics, ISSN 1367-2630,
DOI: 10.1088/1367-2630/11/11/115023,
[Article]

Stark, R. W. (2009):
Dynamics of repulsive dual frequency atomic force microscopy.
In: Appl. Phys. Lett., 94, pp. 063109. [Article]

Stark, R. W. (2009):
Topography-induced forces in amplitude modulated dynamic atomic-force microscopy.
In: Journal of Scanning Probe Microscopy, 4 (1), pp. 1-6. American Scientific Publishers, ISSN 1557-7937,
DOI: 10.1166/jspm.2009.1001,
[Article]

Bauer, M. ; Gigler, A. M. ; Huber, A. ; Hillenbrand, R. ; Stark, R. W. (2009):
Temperature depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12), pp. 1867 - 1874. Wiley-VCH, ISSN 0377-0486,
DOI: 10.1002/jrs.2334,
[Article]

Sicard, O. von ; Gigler, A. M. ; Drobek, T. ; Stark, R. W. (2009):
Torsional noise of a colloidal probe in contact with surface-grafted PEG layers.
In: Langmuir, 25 (5), pp. 2924-2927. American Chemical Society, ISSN 0743-7463,
DOI: 10.1021/la8038329,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Stark, R. W. (2009):
Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
In: Ultramicroscopy, 109 (3), pp. 275-279. Elsevier, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2008.11.016,
[Article]

Bauer, M. ; Bischoff, M. ; Jukresch, S. ; Hülsenbusch, T. ; Matern, A. ; Görtler, A. ; Stark, R. W. ; Chuvilin, A. ; Kaiser, U. (2009):
Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers.
In: Optics Express, 17 (10), pp. 8253-8263. Optical Society of America (OSA), e-ISSN 1094-4087,
DOI: 10.1364/OE.17.008253,
[Article]

Peter, D. ; Dalmer, M. ; Kruwinus, H. ; Lechner, A. ; Archer, L. ; Gaulhofer, E. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2009):
Measurement of the mechanical stability of semiconductor line structures in relevant media.
In: Vol. 16, iss. 4, In: ECS Trans, p. 13,
[Conference or Workshop Item]

Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, 17 (25), pp. 22351-22357. Optical Society of America (OSA), e-ISSN 1094-4087,
DOI: 10.1364/OE.17.022351,
[Article]

Bauer, M. ; Bischoff, M. ; Hülsenbusch, T. ; Matern, A. ; Stark, R. W. ; Kaiser, N. (2009):
Onset of the optical damage in CaF2 optics caused by deep-UV lasers.
In: Optics Letters, 34 (24), pp. 3815-3817. ISSN 0146-9592,
DOI: 10.1364/OL.34.003815,
[Article]

Bauer, M. ; Gigler, A. M. ; Huber, A. J. ; Hillenbrand, R. ; Stark, R. W. (2009):
Temperature-depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12), pp. 1867-1874. ISSN 0377-0486,
[Article]

Wei, T. ; Gong, J. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. ; Rössle, S. C. (2008):
LRRML: a conformational database and an XML description of leucine-rich repeats (LRRs).
In: BMC Structural Biology, 8 (47), BioMed Central, e-ISSN 1472-6807,
DOI: 10.1186/1472-6807-8-47,
[Article]

Walther, F. ; Heckl, W. M. ; Stark, R. W. (2008):
Evaluation of Nanoscale Roughness Measurements on a Plasma Treated SU-8 Polymer Surface by Atomic Force Microscopy.
In: Applied Surface Science, 254 (22), pp. 7290-7295. Elsevier, ISSN 01694332,
DOI: 10.1016/j.apsusc.2008.05.323,
[Article]

Weissmüller, G. ; Yurtsever, A. ; Costa, L. T. ; Pacheco, A. B. F. ; Bisch, P. M. ; Heckl, W. M. ; Stark, R. W. (2008):
Torsional resonance mode atomic force microscopy of a protein-DNA complex.
In: Nano, 3 (6), pp. 443-448. World Scientific Publishing, ISSN 1793-2920,
DOI: 10.1142/S1793292008001374,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Dietz, C. ; Stark, R. W. (2008):
Frequency modulated torsional resonance mode atomic force microscopy on polymers.
In: Applied Physics Letters, 92 (14), p. 143103. American Institute of Physics, ISSN 0003-6951,
[Article]

Bauer, M. ; Gigler, A. M. ; Richter, C. ; Stark, R. W. (2008):
Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy.
In: Microelectronic Engineering, 85 (5-6), pp. 1443-1446. Elsevier, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.089,
[Article]

Hennemeyer, M. ; Walther, F. ; Kerstan, S. ; Schürzinger, K. ; Gigler, A. M. ; Stark, R. W. (2008):
Cell proliferation assays on plasma activated SU-8.
In: Microelectronic Engineering, 85 (5-6), pp. 1298-1301. Elsevier, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.026,
[Article]

Hennemeyer, M. ; Burghardt, S. ; Stark, R. W. (2008):
Cantilever micro-rheometer for the characterization of sugar solutions.
In: Sensors, 8 (1), pp. 10-22. MDPI, e-ISSN 1424-8220,
DOI: 10.3390/s8010010,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Stark, R. W. (2008):
Frequency modulation torsional resonance mode AFM on chlorite (001).
100, In: J. Phys. Conf. Ser., pp. 052033,
[Conference or Workshop Item]

Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14), p. 143107. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2907500,
[Article]

Shimizu, S. ; Shimizu, T. ; Annaratone, B. M. ; Jacob, W. ; Linsmeier, C. ; Lindig, S. ; Stark, R. W. ; Jamitzky, F. ; Thomas, H. ; Sato, N. ; Morfill, G. E. (2007):
The approach to diamond growth on levitating seed particles.
In: Applied Surface Science, 254 (1), pp. 177-180. Elsevier, ISSN 0169-4332,
DOI: 10.1016/j.apsusc.2007.07.017,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Macias, E. ; Stark, R. W. (2007):
Response of a laterally vibrating nano-tip to surface forces.
In: Applied Physics Letters, 91 (25), p. 253120. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2826285,
[Article]

Vázquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2007):
Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers.
In: Nanotechnology, 18 (18), p. 185504. Institute of Physics Publishing (IOP), ISSN 0957-4484,
DOI: 10.1088/0957-4484/18/18/185504,
[Article]

Walther, F. ; Davydovskaya, P. ; Zürcher, S. ; Kaiser, M. ; Herberg, H. ; Gigler, A. M. ; Stark, R. W. (2007):
Stability of the hydrophilic behaviour of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, 17 (3), pp. 524-531. IOP Publishing Ltd., ISSN 0960-1317,
DOI: 10.1088/0960-1317/17/3/015,
[Article]

Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2007):
Multifrequency electrostatic force microscopy in the repulsive regime.
In: Nanotechnology, 18 (6), pp. 065502. Institute of Physics Publishing (IOP), ISSN 0957-4484,
DOI: 10.1088/0957-4484/18/6/065502,
[Article]

Stark, R. W. (2007):
Atomic force microscopy: Getting a feeling for the nanoworld.
In: Nature Nanotechnology, pp. pp. 461 - 462. [Article]

Walther, F. ; Davydovskaya, P. ; Zucher, S. ; Kaiser, M. ; Herberg, H. ; Gigler, A. M. ; Stark, R. W. (2007):
Stability of the hydrophilic behavior of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, 17 (3), pp. 524-531. ISSN 0960-1317,
[Article]

Rubio-Sierra, F. J. ; Vazquez, R. ; Stark, R. W. (2006):
Transfer Function Analysis of the Micro Cantilever used in Atomic Force Microscopy.
In: IEEE Transactions on Nanotechnology, 5 (6), pp. 692-700. IEEE, ISSN 1536-125X,
DOI: 10.1109/TNANO.2006.883479,
[Article]

Rubio-Sierra, F. J. ; Yurtsever, A. ; Hennemeyer, M. ; Heckl, W. M. ; Stark, R. W. (2006):
Acoustical force nano-lithography of thin polymer films.
In: Physica Status Solidi (A), 203 (6), pp. 1481-1486. Wiley-VCH, ISSN 1862-6300,
DOI: 10.1002/pssa.200566152,
[Article]

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. (2006):
Chaos in dynamic atomic force microscopy.
In: Nanotechnology, 17 (7), pp. S213-S220. Institute of Physics Publishing (IOP), ISSN 0957-4484,
DOI: 10.1088/0957-4484/17/7/S19,
[Article]

Stark, R. W. ; Stark, M.
Bhushan, B. ; Fuchs, H. (eds.) (2006):
Higher harmonics in dynamic atomic force microscopy.
In: Applied Scanning Probe Methods II, Springer, Heidelberg, ISBN 3-540-26242-3,
[Book Section]

Walther, F. ; Zürcher, S. ; Hennemeyer, M. ; Kaiser, M. ; Herberg, H. ; Stark, R. W. (2006):
Hydrophobic recovery of SU-8 after O2-plasma treatment.
In: Int. Workshop on Nanomechanical Sensors, pp. pp. 52-53, Copenhagen, Denmark, May 7-10, [Conference or Workshop Item]

Jamitzky, F. ; Stark, R. W. (2006):
Intermittency in dynamic atomic force microscopy.
In: Proc. Int. Symp. Nonlinear Theory and its Applications NOLTA, pp. pp. 915-918,
Bologna, Italy, [Conference or Workshop Item]

Hennemeyer, M. ; Burghardt, S. ; Stark, R. W. (2006):
Low Cost cantilever Rheometer.
pp. pp. 110-111, Int. Workshop on Nanomechanical Sensors, Copenhagen, Denmark, May 7-10, [Conference or Workshop Item]

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2006):
Transfer Function Analysis of a Surface Coupled Atomic Force Microscope.
pp. pp. 6, American Control Conference, Minneapolis, USA, [Conference or Workshop Item]

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2005):
Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach.
In: Journal of Applied Physics, 98 (11), p. 114904. AIP Publishing, ISSN 00218979,
DOI: 10.1063/1.2137887,
[Article]

Kempe, A. ; Wirth, R. ; Altermann, W. ; Stark, R. W. ; Schopf, J. W. ; Heckl, W. M. (2005):
Focussed Ion Beam Preparation and in Situ Nanoscopic Study of Precambrian Acritarchs.
In: Precambrian Research, 140 (1-2), pp. 36-54. Elsevier, ISSN 0301-9268,
DOI: 10.1016/j.precamres.2005.07.002,
[Article]

Rubio-Sierra, F. J. ; Heckl, W. M. ; Stark, R. W. (2005):
Nanomanipulation by Atomic Force Microscopy.
In: Advanced Engineering Materials, 7 (4), pp. 193-196. Wiley-Blackwell-STM, ISSN 1438-1656,
DOI: 10.1002/adem.200400174,
[Article]

Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2005):
Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy.
pp. pp. 879-882, Proc. 5th IEEE Conf. Nanotechnology, Nagoya, Japan, [Conference or Workshop Item]

Stark, R. W. (2005):
Force feedback in dynamic atomic force microscopy.
ASME Int. Mech. Eng. Conf. Exhibition, IMECE, Orlando, FL, USA, [Conference or Workshop Item]

Jamitzky, F. ; Bunk, W. ; Stark, R. W. (2005):
The Influence of Q-Control on the Non-linear Dynamics of Amplitude Modulation Atomic Force Microscopy.
Int. Symp. Nonlinear Theory and its Applications NOLTA, Brugge, Belgium, [Conference or Workshop Item]

Stark, R. W. (2005):
Time Delay Q-Control of the Microcantilever in Dynamic Atomic Force Microscopy.
pp. pp. 413-416, Proc. 5th IEEE Conf. Nanotechnology, Nagoya, Japan, [Conference or Workshop Item]

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2005):
Transfer function analysis of atomic force microscope cantilevers.
ASME Int. Mech. Eng. Conf. Exhibition, IMECE, Orlando, FL, USA, [Conference or Workshop Item]

Stark, R. W. (2004):
Optical lever detection in higher eigenmode dynamic atomic force microscopy.
In: Review of Scientific Instruments, 75 (11), pp. 5053-5055. American Institute of Physics, ISSN 0034-6748, e-ISSN 1089-7623,
DOI: 10.1063/1.1808058,
[Article]

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2004):
Fast contact-mode atomic force microscopy on biological specimen by model-based control.
In: Ultramicroscopy, 100 (3-4), pp. 253-257. Elsevier, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2003.11.008,
[Article]

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2004):
Velocity dependent friction laws in contact mode atomic force microscopy.
In: Ultramicroscopy, 100 (3-4), pp. 309-317. Elsevier, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2003.11.011,
[Article]

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. (2004):
Nonlinear dynamics of a microcantilever in close proximity to a surface.
pp. p. 38-40, Proc. 2004 4th IEEE Conf. Nanotechnology, Munich, Germany, 17.-19. Aug, [Conference or Workshop Item]

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004):
State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy.
In: Physical Review B, 69 (8), pp. 085412. American Physical Society, ISSN 1098-0121,
DOI: 10.1103/PhysRevB.69.085412,
[Article]

Rubio-Sierra, F. J. ; Burghardt, S. ; Kempe, A. ; Heckl, W. M. ; Stark, R. W. (2004):
Atomic force microscope based nanomanipulator for mechanical and optical lithography.
pp. p. 468-470, Proc. 2004 4th IEEE Conf. Nanotechnology, Munich, Germany, 17.-19. Aug, [Conference or Workshop Item]

Mayer, M. ; Fischer, R. ; Lindig, S. ; Toussaint, U. von ; Stark, R. W. ; Dose, V. (2004):
Bayesian reconstruction of surface roughness and depth profiles.
In: Nucl. Instr. Meth. Phys. Res. B, 228, pp. 349-359. [Article]

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2004):
Estimation of the transfer function of a microcantilever used in atomic-force microscopy.
pp. p. 155-157, Proc. 2004 4th IEEE Conf. Nanotechnology, Munich, Germany, 17.-19. Aug, [Conference or Workshop Item]

Stark, R. W. (2004):
Spectroscopy of higher harmonics in dynamic atomic force microscopy.
In: Nanotechnology, 15 (3), pp. 347-351. Institute of Physics Publishing (IOP), ISSN 0957-4484, e-ISSN 1361-6528,
DOI: 10.1088/0957-4484/15/3/020,
[Article]

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004):
Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM.
In: Edited by W. Arnold and S. Hirsekorn, Kluwer Academic/Plenum Publishers, Dordrecht & New York, 27, pp. 741-748, Acoustical Imaging, [Conference or Workshop Item]

Stark, R. W. ; Rubio-Sierra, F. J. ; Thalhammer, S. ; Heckl, W. M. (2003):
Combined nanomanipulation by atomic force microscopy and UV-laser ablation for chromosomal dissection.
In: European Biophysics Journal, 32, pp. 33-39. Springer, ISSN 0175-7571,
DOI: 10.1007/s00249-002-0270-y,
[Article]

Rubio-Sierra, F. J. ; Stark, R. W. ; Thalhammer, S. ; Heckl, W. M. (2003):
Force feedback joystick as a low cost haptic interface for an atomic force microscopy nanomanipulator.
In: Applied Physics A, 76, pp. 903-906. Springer, DOI: 10.1007/s00339-002-1973-8,
[Article]

Stark, R. W. ; Sakai Stalder, M. ; Stemmer, A. (2003):
Microfluidic etching driven by capillary forces for rapid prototyping of gold structures.
In: Microelectronic Engineering, 67-68, pp. 229-236. Elsevier, ISSN 0167-9317,
DOI: 10.1016/S0167-9317(03)00076-5,
[Article]

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2003):
Tuning the interaction forces in tapping mode atomic-force microscopy.
In: Physical Review B, 68 (8), pp. 085401. American Physical Society (APS), ISSN 1098-0121,
DOI: 10.1103/PhysRevB.68.085401,
[Article]

Stark, R. W. ; Heckl, W. M. (2003):
Higher harmonics imaging in tapping mode atomic force microscopy.
In: Review of Scientific Instruments, 74 (12), pp. 5111-5114. American Institute of Physics, ISSN 0034-6748, e-ISSN 1089-7623,
DOI: 10.1063/1.1626008,
[Article]

Stark, R. W. (2003):
Stark Dynamic force spectroscopy: Looking at the total harmonic distortion, in: Recent Advances in Multidisciplinary Applied Physics.
pp. pp. 427-431, Proc. 1st Int. Meeting on Applied Physics 2003 (aphys2003), Badajoz, Spain, [Conference or Workshop Item]

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2003):
Tuning Tip-sample forces in dynamic atomic force microscopy.
pp. pp 377-384, Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 2003 (STM'03), Eindhoven, Netherlands, [Conference or Workshop Item]

Stark, M. ; Stark, R. W. ; Heckl, Wolfgang M. ; Guckenberger, R. (2002):
Inverting dynamic force microscopy: From signals to time-resolved interaction forces.
In: Proceedings of the National Academy of Sciences of the United States of America (PNAS), 99 (13), pp. 8473-8478. DOI: 10.1073/pnas.122040599,
[Article]

Stark, R. W. ; Rubio, J. ; Thalhammer, S. ; Heckl, W. M. (2002):
Extraction and manipulation of biological specimen combining UV-laser-ablation and atomic-force microscopy.
In: Proc. Actuator 2002, pp. 117-120, 8th Int. Conf. on New Actuators, Bremen, Germany, [Conference or Workshop Item]

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2002):
Fast feedback control of piezoelectric actuators.
In: Proc. Actuator 2002, pp. pp. 430-433, 8th Int. Conf. on New Actuators 2002, Bremen, Germany, [Conference or Workshop Item]

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2002):
Sensors for closed-loop piezo control: strain gauges versus optical sensors.
In: Meas. Sci. Technol, 13, pp. pp. N47-N48. [Article]

Thalhammer, S. ; Köhler, U. ; Stark, R. W. ; Heckl, W. M. (2001):
GTG banding pattern on human metaphase chromosomes revealed by atomic force microscopy.
In: Journal of Microscopy, 202 (3), pp. 464-467. Wiley-Blackwell - STM, ISSN 0022-2720; 0368-3974,
DOI: 10.1046/j.1365-2818.2001.00909.x,
[Article]

Drobek, T. ; Stark, R. W. ; Heckl, W. M. (2001):
Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy.
In: Physical Review B, 64, pp. 045401. American Physical Society (APS), ISSN 1098-0121,
DOI: 10.1103/PhysRevB.64.045401,
[Article]

Jamitzky, F. ; Stark, R. W. ; Bunk, W. ; Thalhammer, S. ; Räth, C. ; Aschenbrenner, T. ; Morfill, G. E. ; Heckl, W. M. (2001):
Scaling-index method as an image processing tool in scanning-probe microscopy.
In: Ultramicroscopy, 86 (1-2), pp. 241-246. Elsevier, ISSN 0304-3991, e-ISSN 1879-2723,
DOI: 10.1016/S0304-3991(00)00111-X,
[Article]

Stark, R. W. ; Schitter, G. ; Rubio, J. ; Thalhammer, S. ; Stemmer, A. ; Heckl, W. M. (2001):
Nanohandling and manipulation of biological specimen by atomic-force microscopy.
pp. 90, 2001, Europ. Cells & Mat., [Conference or Workshop Item]

Stark, R. W. ; Drobek, T. ; Heckl, W. M. (2001):
Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy.
In: Ultramicroscopy, 86 (1-2), pp. 207-215. Elsevier, ISSN 0304-3991,
DOI: 10.1016/S0304-3991(00)00077-2,
[Article]

Gobbi, P. ; Thalhammer, S. ; Falconi, M. ; Stark, R. W. ; Heckl, W. M. ; Mazzotti, G. (2000):
Correlative high resolution morphologic analysis of the three-dimensional organization of human chromosomes.
In: Scanning, 22 (5), pp. 273-281. Wiley, ISSN 0161-0457,
DOI: 10.1002/sca.4950220501,
[Article]

Stark, M. ; Stark, R. W. ; Heckl, W. M. ; Guckenberger, R. (2000):
Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic force microscopy.
In: Applied Physics Letters, 77 (20), pp. 3293-3295. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.1325404,
[Article]

Göttlich, H. ; Stark, R. W. ; Pedarnig, J. D. ; Heckl, W. M. (2000):
Noncontact scanning force microscopy based on modified tuning fork sensor.
In: Review of Scientific Instruments, 71 (8), pp. 3104-3107. American Institute of Physics, ISSN 0034-6748,
DOI: 10.1063/1.1304881,
[Article]

Stark, R. W. ; Heckl, W. M. (2000):
Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation.
In: Surface Science, 457 (1-2), pp. 219-228. Elsevier, DOI: 10.1016/S0039-6028(00)00378-2,
[Article]

Drobek, T. ; Stark, R. W. ; Gräber, M. ; Heckl, W. M. (1999):
Overtone atomic force microscopy studies of decagonal quasicrystal surfaces.
In: New Journal of Physics, 1, pp. 15.1-15.11. Institute of Physics Publishing (IOP), e-ISSN 1367-2630,
DOI: 10.1088/1367-2630/1/1/315,
[Article]

Stark, R. W. ; Drobek, T. ; Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Applied Physics Letters, 74 (22), pp. 3296-3298. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.123323,
[Article]

Jamitzky, F. ; Stark, R. W. ; Morfill, G. ; Heckl, W. M. (1998):
Decomposition of atomic force microscopy images using the scaling index method for the investigation of DNA.
In: Journal of Computer-Assisted Microscopy, 10 (2), pp. 57-62. Springer, ISSN 1040-7286, e-ISSN 1573-8671,
DOI: 10.1023/A:1023372420594,
[Article]

Stark, R. W. ; Thalhammer, S. ; Wienberg, J. ; Heckl, W. M. (1998):
The AFM as a tool for chromosomal dissection – the influence of physical parameters.
In: Applied Physics A, 66, pp. S579-S584. Springer, e-ISSN 1432-0630,
DOI: 10.1007/s003390051205,
[Article]

Westall, F. ; Gobbi, P. ; Mazzotti, G. ; Gerneke, D. ; Stark, R. W. ; Drobek, T. ; Heckl, W. M. ; Gibson, E. ; McKay, D. ; Allen, C. ; Steel, A. ; Thomas-Keprta, K. (1998):
Combined SEM (secondary electrons, backscatter, cathodoluminescence) and atomic force microscope investigation of the carbonate globules in Martian meteorite ALH84001 preliminary results.
Vol. 3, pp. 225-233, Proc. SPIE, [Conference or Workshop Item]

Thalhammer, S. ; Stark, R. W. ; Müller, S. ; Wienberg, J. ; Heckl, W. M. (1997):
The Atomic Force Microscope as a New Microdissecting Tool for the Generation of Genetic Probes.
In: Journal of structural biology, 119 (2), pp. 232-237. Elsevier, ISSN 1095-8657,
DOI: 10.1006/jsbi.1997.3869,
[Article]

Thalhammer, S. ; Stark, R. W. ; Schütze, K. ; Wienberg, J. ; Heckl, W. M. (1997):
Laser Microdissection of Metaphase chromosomes and characterization by atomic force microscopy.
In: Journal of Biomedical Optics (JBO), 2 (1), pp. 115-119. SPIE, ISSN 1083-3668,
DOI: 10.1117/12.259626,
[Article]

This list was generated on Sat May 28 02:25:50 2022 CEST.