Lübbe, M. ; Gigler, A. M. ; Stark, R. W. ; Moritz, W. (2010)
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surface Science, 604 (7-8)
doi: 10.1016/j.susc.2010.01.015
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Jeutter, N. M. ; Hennemeyer, M. ; Stark, R. ; Stierle, A. ; Moritz, W. (2006)
Growth of epitaxial Pr2O3 layers on Si(1 1 1).
In: Materials Science in Semiconductor Processing, 9 (6)
doi: 10.1016/j.mssp.2006.10.045
Artikel, Bibliographie