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Lübbe, M. and Gigler, A. M. and Stark, R. W. and Moritz, W. (2010):
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surf. Sci, pp. pp 679-685, vol. 6, [Article]

Jeutter, N. M. and Hennemeyer, M. and Stark, R. and Stierle, A. and Moritz, W. (2006):
Growth of epitaxial Pr2O3 layers on Si(1 1 1).
In: Mater. Sci. Semicond. Proc., pp. pp. 1079 - 1083, vol. 9, [Article]

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