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Lübbe, M. and Gigler, A. M. and Stark, R. W. and Moritz, W. (2010):
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surface Science, 604 (7-8), pp. 679-685. Elsevier, ISSN 0039-6028,
DOI: 10.1016/j.susc.2010.01.015,

Jeutter, N. M. and Hennemeyer, M. and Stark, R. and Stierle, A. and Moritz, W. (2006):
Growth of epitaxial Pr2O3 layers on Si(1 1 1).
In: Materials Science in Semiconductor Processing, 9 (6), pp. 1079 - 1083. Elsevier, ISSN 1369-8001,
DOI: 10.1016/j.mssp.2006.10.045,

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