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Number of items: 4.

Petzold, S. ; Zintler, Alexander ; Eilhardt, Robert ; Piros, E. ; Kaiser, N. ; Sharath, S. U. ; Vogel, T. ; Major, M. ; McKenna, K. P. ; Molina-Luna, Leopoldo ; Alff, Lambert (2019):
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices.
In: Advanced Electronic Materials, 25 (S2), pp. 1842-1843. WILEY, ISSN 2199160X,
DOI: 0.1017/S1431927619009942,
[Article]

Petzold, S. ; Miranda, E. ; Sharath, S.U. ; Munos-Gorriz, J. ; Vogel, T. ; Piros, E. ; Kaiser, N. ; Eilhardt, Robert ; Zintler, Alexander ; Molina-Luna, Leopoldo ; Sune, J. ; Alff, Lambert (2019):
Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
In: Journal of Applied Physics, (125), p. 234503. ISSN 00218979,
DOI: 10.1063/1.5094864,
[Article]

Zintler, Alexander ; Eilhardt, Robert ; Petzold, S. ; Kaiser, N. ; Ulhas, S. ; Alff, Lambert ; Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Proceedings of Microscopy & Microanalysis, 25 (S2), pp. 1842-1843. Microscopy Society of America, DOI: 10.1017/S1431927619009942,
[Article]

Bauer, M. ; Bischoff, M. ; Hülsenbusch, T. ; Matern, A. ; Stark, R. W. ; Kaiser, N. (2009):
Onset of the optical damage in CaF2 optics caused by deep-UV lasers.
In: Optics Letters, 34 (24), pp. 3815-3817. ISSN 0146-9592,
DOI: 10.1364/OL.34.003815,
[Article]

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