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Nanotomography with enhanced resolution using bimodal atomic force microscopy

Dietz, C. and Zerson, M. and Riesch, C. and Gigler, A. M. and Stark, R. W. and Rehse, N. and Magerle, R. :
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Appl. Phys. Lett., vol. 9 (art. 1)
[Article] , (2008)

Item Type: Article
Erschienen: 2008
Creators: Dietz, C. and Zerson, M. and Riesch, C. and Gigler, A. M. and Stark, R. W. and Rehse, N. and Magerle, R.
Title: Nanotomography with enhanced resolution using bimodal atomic force microscopy
Language: English
Journal or Publication Title: Appl. Phys. Lett.
Volume: vol. 9
Number: art. 1
Divisions: ?? fb99_csi~fg5 ??
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Date Deposited: 08 Jun 2010 07:01
Identification Number: doi:10.1063/1.2907500
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