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Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. :
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, vol. 1 pp. 22351–22357.
[Article] , (2009)

Ostrowski, Thomas and Ziegler, A. and Bordia, Rajendra K. and Rödel, Jürgen :
Evolution of Young's modulus, strength and microstructure during liquid phase sintering.
In: Journal of the American Ceramic Society, 81 (7) pp. 1852-1860. ISSN 0002-7820
[Article] , (1998)

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