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Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, 17 (25), pp. 22351-22357. Optical Society of America (OSA), e-ISSN 1094-4087,
DOI: 10.1364/OE.17.022351,
[Article]

Ostrowski, Thomas ; Ziegler, A. ; Bordia, Rajendra K. ; Rödel, Jürgen (1998):
Evolution of Young's modulus, strength and microstructure during liquid phase sintering.
81, In: Journal of the American Ceramic Society, (7), pp. 1852-1860. Wiley-Blackwell, ISSN 0002-7820,
[Article]

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