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Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, pp. pp. 22351–22357, vol. 1, [Article]

Ostrowski, Thomas and Ziegler, A. and Bordia, Rajendra K. and Rödel, Jürgen (1998):
Evolution of Young's modulus, strength and microstructure during liquid phase sintering.
In: Journal of the American Ceramic Society, pp. 1852-1860, 81, (7), ISSN 0002-7820,
[Article]

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