Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2007)
Multifrequency electrostatic force microscopy in the repulsive regime.
In: Nanotechnology, 18 (6)
doi: 10.1088/0957-4484/18/6/065502
Artikel, Bibliographie

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2005)
Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach.
In: Journal of Applied Physics, 98 (11)
doi: 10.1063/1.2137887
Artikel, Bibliographie

Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2005)
Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy.
Proc. 5th IEEE Conf. Nanotechnology. Nagoya, Japan
Konferenzveröffentlichung, Bibliographie

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2004)
Fast contact-mode atomic force microscopy on biological specimen by model-based control.
In: Ultramicroscopy, 100 (3-4)
doi: 10.1016/j.ultramic.2003.11.008
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2004)
Velocity dependent friction laws in contact mode atomic force microscopy.
In: Ultramicroscopy, 100 (3-4)
doi: 10.1016/j.ultramic.2003.11.011
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004)
State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy.
In: Physical Review B, 69 (8)
doi: 10.1103/PhysRevB.69.085412
Artikel, Bibliographie

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2004)
Estimation of the transfer function of a microcantilever used in atomic-force microscopy.
Proc. 2004 4th IEEE Conf. Nanotechnology. Munich, Germany (17.-19. Aug)
Konferenzveröffentlichung, Bibliographie

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004)
Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM.
Acoustical Imaging.
Konferenzveröffentlichung, Bibliographie

Stark, R. W. ; Sakai Stalder, M. ; Stemmer, A. (2003)
Microfluidic etching driven by capillary forces for rapid prototyping of gold structures.
In: Microelectronic Engineering, 67-68
doi: 10.1016/S0167-9317(03)00076-5
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2003)
Tuning the interaction forces in tapping mode atomic-force microscopy.
In: Physical Review B, 68 (8)
doi: 10.1103/PhysRevB.68.085401
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Stemmer, A. (2003)
Tuning Tip-sample forces in dynamic atomic force microscopy.
Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 2003 (STM'03). Eindhoven, Netherlands
Konferenzveröffentlichung, Bibliographie

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2002)
Fast feedback control of piezoelectric actuators.
8th Int. Conf. on New Actuators 2002. Bremen, Germany
Konferenzveröffentlichung, Bibliographie

Schitter, G. ; Stark, R. W. ; Stemmer, A. (2002)
Sensors for closed-loop piezo control: strain gauges versus optical sensors.
In: Meas. Sci. Technol, 13
doi: 10.1088/0957-0233/13/4/404
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Rubio, J. ; Thalhammer, S. ; Stemmer, A. ; Heckl, W. M. (2001)
Nanohandling and manipulation of biological specimen by atomic-force microscopy.
Europ. Cells & Mat..
Konferenzveröffentlichung, Bibliographie