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Number of items: 9.

Schitter, G. and Stark, R. W. and Stemmer, A. (2004):
Fast contact-mode atomic force microscopy on biological specimen by model-based control.
In: Ultramicroscopy, (3-4), 100. Elsevier, pp. 253-257, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2003.11.008,
[Article]

Stark, R. W. and Schitter, G. and Stemmer, A. (2004):
Velocity dependent friction laws in contact mode atomic force microscopy.
In: Ultramicroscopy, (3-4), 100. Elsevier, pp. 309-317, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2003.11.011,
[Article]

Stark, R. W. and Schitter, G. and Stark, M. and Guckenberger, R. and Stemmer, A. (2004):
State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy.
In: Physical Review B, (8), 69. American Physical Society, pp. 085412, ISSN 1098-0121,
DOI: 10.1103/PhysRevB.69.085412,
[Article]

Stark, R. W. and Schitter, G. and Stark, M. and Guckenberger, R. and Stemmer, A. (2004):
Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM.
27In: Edited by W. Arnold and S. Hirsekorn, Kluwer Academic/Plenum Publishers, Dordrecht & New York, In: Acoustical Imaging, pp. 741-748, [Conference or Workshop Item]

Stark, R. W. and Schitter, G. and Stemmer, A. (2003):
Tuning the interaction forces in tapping mode atomic-force microscopy.
In: Physical Review B, (8), 68. American Physical Society (APS), pp. 085401, ISSN 1098-0121,
DOI: 10.1103/PhysRevB.68.085401,
[Article]

Stark, R. W. and Schitter, G. and Stemmer, A. (2003):
Tuning Tip-sample forces in dynamic atomic force microscopy.
In: Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 2003 (STM'03), Eindhoven, Netherlands, pp. pp 377-384, [Conference or Workshop Item]

Schitter, G. and Stark, R. W. and Stemmer, A. (2002):
Fast feedback control of piezoelectric actuators.
In: Proc. Actuator 2002, In: 8th Int. Conf. on New Actuators 2002, Bremen, Germany, pp. pp. 430-433, [Conference or Workshop Item]

Schitter, G. and Stark, R. W. and Stemmer, A. (2002):
Sensors for closed-loop piezo control: strain gauges versus optical sensors.
In: Meas. Sci. Technol, 13pp. pp. N47-N48, [Article]

Stark, R. W. and Schitter, G. and Rubio, J. and Thalhammer, S. and Stemmer, A. and Heckl, W. M. (2001):
Nanohandling and manipulation of biological specimen by atomic-force microscopy.
In: Europ. Cells & Mat., pp. 90, 2001, [Conference or Workshop Item]

This list was generated on Tue May 26 00:49:03 2020 CEST.