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Number of items: 5.

Pompl, R. and Jamitzky, F. and Shimizu, T. and Steffes, B. and Bunk, W. and Schmidt, H. and Georgi, M. and Ramrath, K. and Stolz, W. and Stark, R. W. and Urayama, T. and Fujii, S. and Morfill, G. (2009):
Effect of low-temperature plasma on bacteria observed by repeated AFM-imaging.
In: New Journal of Physics, 11. Institute of Physics, p. 115023, ISSN 1367-2630,
DOI: 10.1088/1367-2630/11/11/115023,
[Article]

Jamitzky, F. and Stark, M. and Bunk, W. and Heckl, W. M. and Stark, R. W. (2006):
Chaos in dynamic atomic force microscopy.
In: Nanotechnology, (7), 17. Institute of Physics Publishing (IOP), pp. S213-S220, ISSN 0957-4484,
DOI: 10.1088/0957-4484/17/7/S19,
[Article]

Jamitzky, F. and Bunk, W. and Stark, R. W. (2005):
The Influence of Q-Control on the Non-linear Dynamics of Amplitude Modulation Atomic Force Microscopy.
In: Int. Symp. Nonlinear Theory and its Applications NOLTA, Brugge, Belgium, [Conference or Workshop Item]

Jamitzky, F. and Stark, M. and Bunk, W. and Heckl, W. M. and Stark, R. W. (2004):
Nonlinear dynamics of a microcantilever in close proximity to a surface.
In: Proc. 2004 4th IEEE Conf. Nanotechnology, Munich, Germany, 17.-19. Aug, pp. p. 38-40, [Conference or Workshop Item]

Jamitzky, F. and Stark, R. W. and Bunk, W. and Thalhammer, S. and Räth, C. and Aschenbrenner, T. and Morfill, G. E. and Heckl, W. M. (2001):
Scaling-index method as an image processing tool in scanning-probe microscopy.
In: Ultramicroscopy, (1-2), 86. Elsevier, pp. 241-246, ISSN 0304-3991, e-ISSN 1879-2723,
DOI: 10.1016/S0304-3991(00)00111-X,
[Article]

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