Stark, R. W. and Drobek, T. and Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Applied Physics Letters, 74 (22), pp. 3296-3298. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.123323,
[Article]
Item Type: | Article |
---|---|
Erschienen: | 1999 |
Creators: | Stark, R. W. and Drobek, T. and Heckl, W. M. |
Title: | Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes |
Language: | English |
Journal or Publication Title: | Applied Physics Letters |
Journal volume: | 74 |
Number: | 22 |
Publisher: | American Institute of Physics |
Divisions: | Zentrale Einrichtungen ?? fb99_csi~fg5 ?? |
Date Deposited: | 22 Jun 2010 09:22 |
DOI: | 10.1063/1.123323 |
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Suche nach Titel in: | TUfind oder in Google |
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