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Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.

Stark, R. W. and Drobek, T. and Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Appl. Phys. Lett.,, pp. 3296-3298, vol. 7, [Article]

Item Type: Article
Erschienen: 1999
Creators: Stark, R. W. and Drobek, T. and Heckl, W. M.
Title: Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
Language: English
Journal or Publication Title: Appl. Phys. Lett.,
Volume: vol. 7
Divisions: ?? fb99_csi~fg5 ??
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Date Deposited: 22 Jun 2010 09:22
Identification Number: doi:10.1063/1.123323
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