Stark, R. W. and Drobek, T. and Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Appl. Phys. Lett.,, pp. 3296-3298, vol. 7, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1999 |
| Creators: | Stark, R. W. and Drobek, T. and Heckl, W. M. |
| Title: | Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes. |
| Language: | English |
| Journal or Publication Title: | Appl. Phys. Lett., |
| Volume: | vol. 7 |
| Divisions: | ?? fb99_csi~fg5 ?? UNSPECIFIED Zentrale Einrichtungen |
| Date Deposited: | 22 Jun 2010 09:22 |
| Identification Number: | doi:10.1063/1.123323 |
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