Stark, R. W. and Drobek, T. and Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Applied Physics Letters, 74 (22), pp. 3296-3298. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.123323,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1999 |
| Creators: | Stark, R. W. and Drobek, T. and Heckl, W. M. |
| Title: | Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes |
| Language: | English |
| Journal or Publication Title: | Applied Physics Letters |
| Journal volume: | 74 |
| Number: | 22 |
| Publisher: | American Institute of Physics |
| Divisions: | Zentrale Einrichtungen ?? fb99_csi~fg5 ?? |
| Date Deposited: | 22 Jun 2010 09:22 |
| DOI: | 10.1063/1.123323 |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
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