TU Darmstadt / ULB / TUbiblio

Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes

Stark, R. W. and Drobek, T. and Heckl, W. M. (1999):
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Applied Physics Letters, 74 (22), pp. 3296-3298. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.123323,
[Article]

Item Type: Article
Erschienen: 1999
Creators: Stark, R. W. and Drobek, T. and Heckl, W. M.
Title: Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes
Language: English
Journal or Publication Title: Applied Physics Letters
Journal volume: 74
Number: 22
Publisher: American Institute of Physics
Divisions: Zentrale Einrichtungen
?? fb99_csi~fg5 ??
Date Deposited: 22 Jun 2010 09:22
DOI: 10.1063/1.123323
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details