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Number of items: 3.

Peter, D. and Dalmer, M. and Lechner, A. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2012):
The influence of liquid media on the fracture strength of polysilicon nanostructures.
In: Diffusion and Defect Data Part B (Solid State Phenomena), 187pp. 127-30, [Article]

Peter, D. and Dalmer, M. and Lechner, A. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2011):
Maesurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse.
In: J. Micromech. Microeng., 21pp. 025001, [Article]

Peter, D. and Dalmer, M. and Kruwinus, H. and Lechner, A. and Archer, L. and Gaulhofer, E. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2009):
Measurement of the mechanical stability of semiconductor line structures in relevant media.
iss. 4In: Vol. 16, In: ECS Trans, p. 13, [Conference or Workshop Item]

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