  |
 | Up a level |
Dietz, C. and Zerson, M. and Riesch, C. and Gigler, A. M. and Stark, R. W. and Rehse, N. and Magerle, R.
:
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In:
Appl. Phys. Lett., vol. 9
(art. 1)
[Article]
, (2008)
Print
Impressum