TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Number of items: 3.

Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. :
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, vol. 1 pp. 22351–22357.
[Article] , (2009)

Bauer, M. and Gigler, A. M. and Huber, A. and Hillenbrand, R. and Stark, R. W. :
Temperature depending Raman line-shift of silicon carbide.
In: J. Raman Spetrosc, vol. 4 pp. 1867 - 1874.
[Article] , (2009)

Bauer, M. and Gigler, A. M. and Huber, A. J. and Hillenbrand, R. and Stark, R. W. :
Temperature-depending Raman line-shift of silicon carbide.
[Online-Edition: http://dx.doi.org/10.1002/jrs.2334]
In: Journal of Raman Spectroscopy, 40 (12) pp. 1867-1874. ISSN 0377-0486
[Article] , (2009)

This list was generated on Sat May 18 00:40:30 2019 CEST.