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Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
vol. 1, In: Optics Express, pp. pp. 22351–22357, [Article]

Bauer, M. and Gigler, A. M. and Huber, A. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature depending Raman line-shift of silicon carbide.
vol. 4, In: J. Raman Spetrosc, pp. pp. 1867 - 1874, [Article]

Bauer, M. and Gigler, A. M. and Huber, A. J. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature-depending Raman line-shift of silicon carbide.
40, In: Journal of Raman Spectroscopy, (12), pp. 1867-1874, ISSN 0377-0486, [Online-Edition: http://dx.doi.org/10.1002/jrs.2334],
[Article]

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