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Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy

Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. :
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, vol. 1 pp. 22351–22357.
[Article] , (2009)

Item Type: Article
Erschienen: 2009
Creators: Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W.
Title: Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy
Language: English
Journal or Publication Title: Optics Express
Volume: vol. 1
Divisions: ?? fb99_csi~fg5 ??
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Date Deposited: 04 Jun 2010 10:19
Identification Number: doi:10.1364/OE.17.022351
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