Baumann, M. and Stark, R. W. (2010):
Dual frequency atomic force microscopy on charged surfaces.
In: Ultramicroscopy, 110, pp. 578-581. [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2010 |
| Creators: | Baumann, M. and Stark, R. W. |
| Title: | Dual frequency atomic force microscopy on charged surfaces |
| Language: | English |
| Journal or Publication Title: | Ultramicroscopy |
| Journal volume: | 110 |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Physics of Surfaces Exzellenzinitiative Exzellenzinitiative > Clusters of Excellence Zentrale Einrichtungen Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI) ?? fb99_csi~fg5 ?? 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences |
| Date Deposited: | 04 Jun 2010 09:38 |
| Identification Number: | doi:10.1016/j.ultramic.2010.02.013 |
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