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Dual frequency atomic force microscopy on charged surfaces

Baumann, M. and Stark, R. W. :
Dual frequency atomic force microscopy on charged surfaces.
In: Ultramicroscopy, 110 pp. 578-581.
[Article], (2010)

Item Type: Article
Erschienen: 2010
Creators: Baumann, M. and Stark, R. W.
Title: Dual frequency atomic force microscopy on charged surfaces
Language: German
Journal or Publication Title: Ultramicroscopy
Volume: 110
Divisions: Zentrale Einrichtungen
Zentrale Einrichtungen > Center of Smart Interfaces (CSI)
Zentrale Einrichtungen > Center of Smart Interfaces (CSI) > Center of Smart Interfaces Publications
Zentrale Einrichtungen > Center of Smart Interfaces (CSI) > FG5 Physics of Surfaces
Date Deposited: 04 Jun 2010 09:38
Identification Number: 10.1016/j.ultramic.2010.02.013
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