Baumann, M. and Stark, R. W.
:
Dual frequency atomic force microscopy on charged surfaces.
In:
Ultramicroscopy, 110
pp. 578-581.
[Article], (2010)
| Item Type: | Article |
|---|---|
| Erschienen: | 2010 |
| Creators: | Baumann, M. and Stark, R. W. |
| Title: | Dual frequency atomic force microscopy on charged surfaces |
| Language: | German |
| Journal or Publication Title: | Ultramicroscopy |
| Volume: | 110 |
| Divisions: | Zentrale Einrichtungen Zentrale Einrichtungen > Center of Smart Interfaces (CSI) Zentrale Einrichtungen > Center of Smart Interfaces (CSI) > Center of Smart Interfaces Publications Zentrale Einrichtungen > Center of Smart Interfaces (CSI) > FG5 Physics of Surfaces |
| Date Deposited: | 04 Jun 2010 09:38 |
| Identification Number: | 10.1016/j.ultramic.2010.02.013 |
| Export: |
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