Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. (2009)
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, 17 (25)
doi: 10.1364/OE.17.022351
Artikel, Bibliographie

Bauer, M. ; Gigler, A. M. ; Huber, A. J. ; Hillenbrand, R. ; Stark, R. W. (2009)
Temperature-depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12)
Artikel, Bibliographie