Stark, R. W. and Heckl, W. M. (2000):
Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation.
In: Surface Science, 457 (1-2), pp. 219-228. Elsevier, DOI: 10.1016/S0039-6028(00)00378-2,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2000 |
| Creators: | Stark, R. W. and Heckl, W. M. |
| Title: | Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation |
| Language: | English |
| Journal or Publication Title: | Surface Science |
| Journal volume: | 457 |
| Number: | 1-2 |
| Publisher: | Elsevier |
| Divisions: | Zentrale Einrichtungen ?? fb99_csi~fg5 ?? |
| Date Deposited: | 21 Jun 2010 13:21 |
| DOI: | 10.1016/S0039-6028(00)00378-2 |
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