TU Darmstadt / ULB / TUbiblio

Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

Stark, R. W. and Heckl, W. M. (2000):
Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation.
In: Surface Science, 457 (1-2), pp. 219-228. Elsevier, DOI: 10.1016/S0039-6028(00)00378-2,
[Article]

Item Type: Article
Erschienen: 2000
Creators: Stark, R. W. and Heckl, W. M.
Title: Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation
Language: English
Journal or Publication Title: Surface Science
Journal volume: 457
Number: 1-2
Publisher: Elsevier
Divisions: Zentrale Einrichtungen
?? fb99_csi~fg5 ??
Date Deposited: 21 Jun 2010 13:21
DOI: 10.1016/S0039-6028(00)00378-2
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details