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Higher harmonics imaging in tapping mode atomic force microscopy

Stark, R. W. and Heckl, W. M. (2003):
Higher harmonics imaging in tapping mode atomic force microscopy.
In: Review of Scientific Instruments, 74 (12), pp. 5111-5114. American Institute of Physics, ISSN 0034-6748, e-ISSN 1089-7623,
DOI: 10.1063/1.1626008,
[Article]

Item Type: Article
Erschienen: 2003
Creators: Stark, R. W. and Heckl, W. M.
Title: Higher harmonics imaging in tapping mode atomic force microscopy
Language: English
Journal or Publication Title: Review of Scientific Instruments
Journal volume: 74
Number: 12
Publisher: American Institute of Physics
Divisions: Zentrale Einrichtungen
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Date Deposited: 21 Jun 2010 11:23
DOI: 10.1063/1.1626008
Identification Number: doi:10.1063/1.1626008
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