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Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy

Drobek, T. and Stark, R. W. and Heckl, W. M. (2001):
Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy.
In: Physical Review B, 64, pp. 045401. American Physical Society (APS), ISSN 1098-0121,
DOI: 10.1103/PhysRevB.64.045401,
[Article]

Item Type: Article
Erschienen: 2001
Creators: Drobek, T. and Stark, R. W. and Heckl, W. M.
Title: Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy
Language: English
Journal or Publication Title: Physical Review B
Journal volume: 64
Publisher: American Physical Society (APS)
Divisions: Zentrale Einrichtungen
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Date Deposited: 21 Jun 2010 11:42
DOI: 10.1103/PhysRevB.64.045401
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