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Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy

Drobek, T. and Stark, R. W. and Heckl, W. M. (2001):
Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy.
In: Phys. Rev. B, vol. 6, (art. 0), [Article]

Item Type: Article
Erschienen: 2001
Creators: Drobek, T. and Stark, R. W. and Heckl, W. M.
Title: Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy
Language: English
Journal or Publication Title: Phys. Rev. B
Volume: vol. 6
Number: art. 0
Divisions: ?? fb99_csi~fg5 ??
UNSPECIFIED
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Date Deposited: 21 Jun 2010 11:42
Identification Number: doi:10.1103/PhysRevB.64.045401
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