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Number of items: 19.

Peter, D. ; Dalmer, M. ; Lechner, A. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2012):
The influence of liquid media on the fracture strength of polysilicon nanostructures.
In: Diffusion and Defect Data Part B (Solid State Phenomena), 187, pp. 127-30. [Article]

Peter, D. ; Dalmer, M. ; Lechner, A. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2011):
Maesurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse.
In: J. Micromech. Microeng., 21, pp. 025001. [Article]

Lübbe, M. ; Gigler, A. M. ; Stark, R. W. ; Moritz, W. (2010):
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surface Science, 604 (7-8), pp. 679-685. Elsevier, ISSN 0039-6028,
DOI: 10.1016/j.susc.2010.01.015,
[Article]

Janko, M. ; Zink, A. ; Gigler, A. M. ; Heckl, W. M. ; Stark, R. W. (2010):
Nanostructure and mechanics of mummified type I collagen from the 5300-year-old Tyrolean Iceman.
In: Proc. Roy. Soc. B, 277, pp. 2301-2309. [Article]

Walther, F. ; Drobek, T. ; Gigler, A. M. ; Hennemeyer, M. ; Kaiser, M. ; Herberg, H. ; Shimitsu, T. ; Morfill, G. E. ; Stark, R. W. (2010):
Surface hydrophilisation of SU-8 by plasma and wet chemical processes.
In: Surf. Interf. Anal, 42, pp. 1735-1744. [Article]

Bauer, M. ; Gigler, A. M. ; Huber, A. ; Hillenbrand, R. ; Stark, R. W. (2009):
Temperature depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12), pp. 1867 - 1874. Wiley-VCH, ISSN 0377-0486,
DOI: 10.1002/jrs.2334,
[Article]

Sicard, O. von ; Gigler, A. M. ; Drobek, T. ; Stark, R. W. (2009):
Torsional noise of a colloidal probe in contact with surface-grafted PEG layers.
In: Langmuir, 25 (5), pp. 2924-2927. American Chemical Society, ISSN 0743-7463,
DOI: 10.1021/la8038329,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Stark, R. W. (2009):
Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
In: Ultramicroscopy, 109 (3), pp. 275-279. Elsevier, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2008.11.016,
[Article]

Peter, D. ; Dalmer, M. ; Kruwinus, H. ; Lechner, A. ; Archer, L. ; Gaulhofer, E. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2009):
Measurement of the mechanical stability of semiconductor line structures in relevant media.
In: Vol. 16, iss. 4, In: ECS Trans, p. 13,
[Conference or Workshop Item]

Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, 17 (25), pp. 22351-22357. Optical Society of America (OSA), e-ISSN 1094-4087,
DOI: 10.1364/OE.17.022351,
[Article]

Bauer, M. ; Gigler, A. M. ; Huber, A. J. ; Hillenbrand, R. ; Stark, R. W. (2009):
Temperature-depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12), pp. 1867-1874. ISSN 0377-0486,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Dietz, C. ; Stark, R. W. (2008):
Frequency modulated torsional resonance mode atomic force microscopy on polymers.
In: Applied Physics Letters, 92 (14), p. 143103. American Institute of Physics, ISSN 0003-6951,
[Article]

Bauer, M. ; Gigler, A. M. ; Richter, C. ; Stark, R. W. (2008):
Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy.
In: Microelectronic Engineering, 85 (5-6), pp. 1443-1446. Elsevier, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.089,
[Article]

Hennemeyer, M. ; Walther, F. ; Kerstan, S. ; Schürzinger, K. ; Gigler, A. M. ; Stark, R. W. (2008):
Cell proliferation assays on plasma activated SU-8.
In: Microelectronic Engineering, 85 (5-6), pp. 1298-1301. Elsevier, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.026,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Stark, R. W. (2008):
Frequency modulation torsional resonance mode AFM on chlorite (001).
100, In: J. Phys. Conf. Ser., pp. 052033,
[Conference or Workshop Item]

Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14), p. 143107. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2907500,
[Article]

Yurtsever, A. ; Gigler, A. M. ; Macias, E. ; Stark, R. W. (2007):
Response of a laterally vibrating nano-tip to surface forces.
In: Applied Physics Letters, 91 (25), p. 253120. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2826285,
[Article]

Walther, F. ; Davydovskaya, P. ; Zürcher, S. ; Kaiser, M. ; Herberg, H. ; Gigler, A. M. ; Stark, R. W. (2007):
Stability of the hydrophilic behaviour of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, 17 (3), pp. 524-531. IOP Publishing Ltd., ISSN 0960-1317,
DOI: 10.1088/0960-1317/17/3/015,
[Article]

Walther, F. ; Davydovskaya, P. ; Zucher, S. ; Kaiser, M. ; Herberg, H. ; Gigler, A. M. ; Stark, R. W. (2007):
Stability of the hydrophilic behavior of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, 17 (3), pp. 524-531. ISSN 0960-1317,
[Article]

This list was generated on Tue Jan 18 04:13:33 2022 CET.