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Number of items: 19.

Peter, D. and Dalmer, M. and Lechner, A. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2012):
The influence of liquid media on the fracture strength of polysilicon nanostructures.
In: Diffusion and Defect Data Part B (Solid State Phenomena), 187pp. 127-30, [Article]

Peter, D. and Dalmer, M. and Lechner, A. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2011):
Maesurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse.
In: J. Micromech. Microeng., 21pp. 025001, [Article]

Lübbe, M. and Gigler, A. M. and Stark, R. W. and Moritz, W. (2010):
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surface Science, (7-8), 604. Elsevier, pp. 679-685, ISSN 0039-6028,
DOI: 10.1016/j.susc.2010.01.015,
[Article]

Janko, M. and Zink, A. and Gigler, A. M. and Heckl, W. M. and Stark, R. W. (2010):
Nanostructure and mechanics of mummified type I collagen from the 5300-year-old Tyrolean Iceman.
In: Proc. Roy. Soc. B, 277pp. 2301-2309, [Article]

Walther, F. and Drobek, T. and Gigler, A. M. and Hennemeyer, M. and Kaiser, M. and Herberg, H. and Shimitsu, T. and Morfill, G. E. and Stark, R. W. (2010):
Surface hydrophilisation of SU-8 by plasma and wet chemical processes.
In: Surf. Interf. Anal, 42pp. 1735-1744, [Article]

Bauer, M. and Gigler, A. M. and Huber, A. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, (12), 40. Wiley-VCH, pp. 1867 - 1874, ISSN 0377-0486,
DOI: 10.1002/jrs.2334,
[Article]

von Sicard, O. and Gigler, A. M. and Drobek, T. and Stark, R. W. (2009):
Torsional noise of a colloidal probe in contact with surface-grafted PEG layers.
In: Langmuir, (5), 25. American Chemical Society, pp. 2924-2927, ISSN 0743-7463,
DOI: 10.1021/la8038329,
[Article]

Yurtsever, A. and Gigler, A. M. and Stark, R. W. (2009):
Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
In: Ultramicroscopy, (3), 109. Elsevier, pp. 275-279, ISSN 0304-3991,
DOI: 10.1016/j.ultramic.2008.11.016,
[Article]

Peter, D. and Dalmer, M. and Kruwinus, H. and Lechner, A. and Archer, L. and Gaulhofer, E. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2009):
Measurement of the mechanical stability of semiconductor line structures in relevant media.
iss. 4In: Vol. 16, In: ECS Trans, p. 13, [Conference or Workshop Item]

Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, (25), 17. Optical Society of America (OSA), pp. 22351-22357, e-ISSN 1094-4087,
DOI: 10.1364/OE.17.022351,
[Article]

Bauer, M. and Gigler, A. M. and Huber, A. J. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature-depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, 40 (12), pp. 1867-1874, ISSN 0377-0486,
[Online-Edition: http://dx.doi.org/10.1002/jrs.2334],
[Article]

Yurtsever, A. and Gigler, A. M. and Dietz, C. and Stark, R. W. (2008):
Frequency modulated torsional resonance mode atomic force microscopy on polymers.
In: Applied Physics Letters, (14), 92. American Institute of Physics, p. 143103, ISSN 0003-6951,
[Article]

Bauer, M. and Gigler, A. M. and Richter, C. and Stark, R. W. (2008):
Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy.
In: Microelectronic Engineering, (5-6), 85. Elsevier, pp. 1443-1446, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.089,
[Article]

Hennemeyer, M. and Walther, F. and Kerstan, S. and Schürzinger, K. and Gigler, A. M. and Stark, R. W. (2008):
Cell proliferation assays on plasma activated SU-8.
In: Microelectronic Engineering, (5-6), 85. Elsevier, pp. 1298-1301, ISSN 0167-9317,
DOI: 10.1016/j.mee.2008.01.026,
[Article]

Yurtsever, A. and Gigler, A. M. and Stark, R. W. (2008):
Frequency modulation torsional resonance mode AFM on chlorite (001).
100In: J. Phys. Conf. Ser., pp. 052033, [Conference or Workshop Item]

Dietz, C. and Zerson, M. and Riesch, C. and Gigler, A. M. and Stark, R. W. and Rehse, N. and Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, (14), 92. American Institute of Physics, p. 143107, ISSN 0003-6951,
DOI: 10.1063/1.2907500,
[Article]

Yurtsever, A. and Gigler, A. M. and Macias, E. and Stark, R. W. (2007):
Response of a laterally vibrating nano-tip to surface forces.
In: Applied Physics Letters, (25), 91. American Institute of Physics, p. 253120, ISSN 0003-6951,
DOI: 10.1063/1.2826285,
[Article]

Walther, F. and Davydovskaya, P. and Zürcher, S. and Kaiser, M. and Herberg, H. and Gigler, A. M. and Stark, R. W. (2007):
Stability of the hydrophilic behaviour of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, (3), 17. IOP Publishing Ltd., pp. 524-531, ISSN 0960-1317,
DOI: 10.1088/0960-1317/17/3/015,
[Article]

Walther, F. and Davydovskaya, P. and Zucher, S. and Kaiser, M. and Herberg, H. and Gigler, A. M. and Stark, R. W. (2007):
Stability of the hydrophilic behavior of oxygen plasma activated SU-8.
In: Journal of Micromechanics and Microengineering, 17 (3), pp. 524-531, ISSN 0960-1317,
[Online-Edition: http://dx.doi.org/10.1088/0960-1317/17/3/015],
[Article]

This list was generated on Tue May 26 01:30:22 2020 CEST.