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Number of items: 15.

Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Ulhas, Sharath ; Bruder, Enrico ; Kaiser, Nico ; Alff, Lambert ; Molina-Luna, Leopoldo (2022):
Enhanced Conductivity and Microstructure in Highly Textured TiN1−x/c‑Al2O3 Thin Films.
In: ACS Omega, 2022, pp. 1-8. ACS Publications, ISSN 2470-1343,
DOI: 10.1021/acsomega.1c05505,
[Article]

Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Sharath, Sankaramangalam Ulhas ; Bruder, Enrico ; Kaiser, Nico ; Alff, Lambert ; Molina-Luna, Leopoldo (2022):
Enhanced Conductivity and Microstructure in Highly Textured TiN1–x/c-Al2O3 Thin Films. (Publisher's Version)
In: ACS Omega, 7 (2), pp. 2041-2048. ACS Publications, ISSN 2470-1343,
DOI: 10.26083/tuprints-00021222,
[Article]

Kaiser, Nico ; Vogel, Tobias ; Zintler, Alexander ; Petzold, Stefan ; Arzumanov, Alexey ; Piros, Eszter ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Alff, Lambert (2021):
Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties.
In: ACS Applied Materials & Interfaces, 2021, pp. 1-14. American Chemical Society, ISSN 1944-8244,
DOI: 10.1021/acsami.1c09451,
[Article]

Eilhardt, Robert ; Zintler, Alexander ; Recalde, Oscar ; Nasiou, Déspina ; Petzold, Stefan ; Alff, Lambert ; Molina-Luna, Leopoldo (2021):
Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors.
In: Microscopy and Microanalysis, 27 (S1), pp. 1238-1239. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927621004645,
[Article]

Petzold, Stefan ; Piros, Eszter ; Sharath, Sankaramangalam Ulhas ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, Christian ; Alff, Lambert (2021):
Gradual reset and set characteristics in yttrium oxide based resistive random access memory. (Publisher's Version)
In: Semiconductor Science and Technology, 34 (7), IOP Publishing, ISSN 0268-1242, e-ISSN 1361-6641,
DOI: 10.26083/tuprints-00019328,
[Article]

Schäfer, Nils ; Karabas, Nail ; Palakkal, Jasnamol Pezhumkattil ; Petzold, Stefan ; Major, Marton ; Pietralla, Norbert ; Alff, Lambert (2021):
Kinetically induced low-temperature synthesis of Nb₃Sn thin films. (Publisher's Version)
In: Journal of Applied Physics, 128 (13), AIP Publishing, ISSN 0021-8979, e-ISSN 1089-7550,
DOI: 10.26083/tuprints-00019408,
[Article]

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wengerter, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Neuromorphic Computing: Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2070044. Wiley, ISSN 2199160X,
DOI: 10.1002/aelm.202070044,
[Article]

Piros, Eszter ; Lonsky, Martin ; Petzold, Stefan ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert (2020):
Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy.
In: Physical Review Applied, 14 (3), pp. 034029. American Physical Society, ISSN 2331-7019,
DOI: 10.1103/PhysRevApplied.14.034029,
[Article]

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide-Based RRAM Devices by Oxygen Engineering: From Digital to Multi-Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 2020, Wiley, ISSN 2199-160X,
DOI: 10.1002/aelm.202000439,
[Article]

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2000439. Wiley, ISSN 2199-160X,
DOI: 10.1002/aelm.202000439,
[Article]

Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]

Piros, Eszter ; Petzold, Stefan ; Zintler, Alexander ; Kaiser, Nico ; Vogel, Tobias ; Eilhardt, Robert ; Wenger, Christian ; Molina-Luna, Leopoldo ; Alff, Lambert (2020):
Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier.
In: Applied Physics Letters, 117 (1), pp. 013504. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/5.0009645,
[Article]

Petzold, Stefan (2020):
Defect Engineering in Transition Metal Oxide-based Resistive Random Access Memory.
Darmstadt, Technische Universität,
DOI: 10.25534/tuprints-00011328,
[Ph.D. Thesis]

Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Kaiser, Nico ; Ulhas, Sharath ; Alff, Lambert ; Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Microscopy and Microanalysis, 25 (S2), pp. 1842-1843. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619009942,
[Article]

Niu, Gang ; Calka, Pauline ; Huang, Peng ; Sharath, Sankaramangalam Ulhas ; Petzold, Stefan ; Gloskovskii, Andrei ; Fröhlich, Karol ; Zhao, Yudi ; Kang, Jinfeng ; Schubert, Markus Andreas ; Bärwolf, Florian ; Ren, Wei ; Ye, Zuo-Guang ; Perez, Eduardo ; Wenger, Christian ; Alff, Lambert ; Schroeder, Thomas (2019):
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy.
In: Materials Research Letters, 7 (3), pp. 117-123. Taylor & Francis Inc., Philadelphia, PA, USA, ISSN 2166-3831,
DOI: 10.1080/21663831.2018.1561535,
[Article]

This list was generated on Tue May 17 02:10:43 2022 CEST.