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Number of items: 9.

Petzold, Stefan and Piros, Eszter and Eilhardt, Robert and Zintler, Alexander and Vogel, Tobias and Kaiser, Nico and Radetinac, Aldin and Komissinskiy, Philipp and Jalaguier, Eric and Nolot, Emmanuel and Charpin-Nicolle, Christelle and Wengerter, Christian and Molina-Luna, Leopoldo and Miranda, Enrique and Alff, Lambert (2020):
Neuromorphic Computing: Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2070044. Wiley, ISSN 2199160X,
DOI: 10.1002/aelm.202070044,
[Article]

Piros, Eszter and Lonsky, Martin and Petzold, Stefan and Zintler, Alexander and Sharath, S.U. and Vogel, Tobias and Kaiser, Nico and Eilhardt, Robert and Molina-Luna, Leopoldo and Wenger, Christian and Müller, Jens and Alff, Lambert (2020):
Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy.
In: Physical Review Applied, 14 (3), pp. 034029. American Physical Society, ISSN 2331-7019,
DOI: 10.1103/PhysRevApplied.14.034029,
[Article]

Petzold, Stefan and Piros, Eszter and Eilhardt, Robert and Zintler, Alexander and Vogel, Tobias and Kaiser, Nico and Radetinac, Aldin and Komissinskiy, Philipp and Jalaguir, Eric and Nolot, Emmanuel and Charpin-Nicolle, Christelle and Wenger, Christian and Molina-Luna, Leopoldo and Miranda, Enrique and Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide-Based RRAM Devices by Oxygen Engineering: From Digital to Multi-Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 2020, Wiley, ISSN 2199160X,
DOI: 10.1002/aelm.202000439,
[Article]

Petzold, Stefan and Piros, Eszter and Eilhardt, Robert and Zintler, Alexander and Vogel, Tobias and Kaiser, Nico and Radetinac, Aldin and Komissinskiy, Philipp and Jalaguier, Eric and Nolot, Emmanuel and Charpin‐Nicolle, Christelle and Wenger, Christian and Molina‐Luna, Leopoldo and Miranda, Enrique and Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2000439. Wiley, ISSN 2199-160X,
DOI: 10.1002/aelm.202000439,
[Article]

Zintler, Alexander and Eilhardt, Robert and Wang, Shuai and Krajnak, Matus and Schramowski, Patrick and Stammer, Wolfgang and Petzold, Stefan and Kaiser, Nico and Kerstling, Kristian and Alff, Lambert and Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]

Piros, Eszter and Petzold, Stefan and Zintler, Alexander and Kaiser, Nico and Vogel, Tobias and Eilhardt, Robert and Wenger, Christian and Molina-Luna, Leopoldo and Alff, Lambert (2020):
Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier.
In: Applied Physics Letters, 117 (1), pp. 013504. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/5.0009645,
[Article]

Petzold, Stefan (2020):
Defect Engineering in Transition Metal Oxide-based Resistive Random Access Memory.
Darmstadt, Technische Universität,
DOI: 10.25534/tuprints-00011328,
[Ph.D. Thesis]

Zintler, Alexander and Eilhardt, Robert and Petzold, Stefan and Kaiser, Nico and Ulhas, Sharath and Alff, Lambert and Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Microscopy and Microanalysis, 25 (S2), pp. 1842-1843. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619009942,
[Article]

Niu, Gang and Calka, Pauline and Huang, Peng and Sharath, Sankaramangalam Ulhas and Petzold, Stefan and Gloskovskii, Andrei and Fröhlich, Karol and Zhao, Yudi and Kang, Jinfeng and Schubert, Markus Andreas and Bärwolf, Florian and Ren, Wei and Ye, Zuo-Guang and Perez, Eduardo and Wenger, Christian and Alff, Lambert and Schroeder, Thomas (2019):
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy.
In: Materials Research Letters, 7 (3), pp. 117-123. Taylor & Francis Inc., Philadelphia, PA, USA, ISSN 2166-3831,
DOI: 10.1080/21663831.2018.1561535,
[Article]

This list was generated on Sat Mar 6 00:59:58 2021 CET.