Winkler, Robert ; Zintler, Alexander ; Recalde-Benitez, Oscar ; Jiang, Tianshu ; Nasiou, Déspina ; Adabifiroozjaei, Esmaeil ; Schreyer, Philipp ; Kim, Taewook ; Piros, Eszter ; Kaiser, Nico ; Vogel, Tobias ; Petzold, Stefan ; Alff, Lambert ; Molina-Luna, Leopoldo (2024)
Texture transfer in dielectric layers via nanocrystalline networks: insights from in situ 4D-STEM.
In: Nano Letters
doi: 10.1021/acs.nanolett.3c03941
Artikel, Bibliographie

Kim, Taewook ; Vogel, Tobias ; Piros, Eszter ; Nasiou, Déspina ; Kaiser, Nico ; Schreyer, Philipp ; Winkler, Robert ; Zintler, Alexander ; Arzumanov, Alexey ; Petzold, Stefan ; Molina-Luna, Leopoldo ; Alff, Lambert (2023)
Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices.
In: Applied Physics Letters, 2023 (122)
doi: 10.1063/5.0124781
Artikel, Bibliographie

Vogel, Tobias ; Zintler, Alexander ; Kaiser, Nico ; Guillaume, Nicolas ; Lefèvre, Gauthier ; Lederer, Maximilian ; Serra, Anna Lisa ; Piros, Eszter ; Kim, Taewook ; Schreyer, Philipp ; Winkler, Robert ; Nasiou, Déspina ; Revello Olivo, Ricardo ; Ali, Tarek ; Lehninger, David ; Arzumanov, Alexey ; Charpin-Nicolle, Christelle ; Bourgeois, Guillaume ; Grenouillet, Laurent ; Cyrille, Marie-Claire ; Navarro, Gabriele ; Seidel, Konrad ; Kämpfe, Thomas ; Petzold, Stefan ; Trautmann, Christina ; Molina-Luna, Leopoldo ; Alff, Lambert (2022)
Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation.
In: ACS Nano, 16 (9)
doi: 10.1021/acsnano.2c04841
Artikel, Bibliographie

Winkler, Robert ; Zintler, Alexander ; Petzold, Stefan ; Piros, Eszter ; Kaiser, Nico ; Vogel, Tobias ; Nasiou, Déspina ; McKenna, K. P. ; Molina-Luna, Leopoldo ; Alff, Lambert (2022)
Controlling the Formation of Conductive Pathways in Memristive Devices.
In: Advanced Science
doi: 10.1002/advs.202201806
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Lederer, Maximilian ; Vogel, Tobias ; Kämpfe, Thomas ; Kaiser, Nico ; Piros, Eszter ; Olivo, Ricardo ; Ali, Tarek ; Petzold, Stefan ; Lehninger, David ; Trautmann, Christina ; Alff, Lambert ; Seidel, Konrad (2022)
Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia.
In: Journal of Applied Physics, 132 (6)
doi: 10.1063/5.0098953
Artikel, Bibliographie

Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Ulhas, Sharath ; Bruder, Enrico ; Kaiser, Nico ; Alff, Lambert ; Molina-Luna, Leopoldo (2022)
Enhanced Conductivity and Microstructure in Highly Textured TiN1−x/c‑Al2O3 Thin Films.
In: ACS Omega, 2022
doi: 10.1021/acsomega.1c05505
Artikel, Bibliographie

Kaiser, Nico ; Vogel, Tobias ; Zintler, Alexander ; Petzold, Stefan ; Arzumanov, Alexey ; Piros, Eszter ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Alff, Lambert (2021)
Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties.
In: ACS Applied Materials & Interfaces, 2021
doi: 10.1021/acsami.1c09451
Artikel, Bibliographie

Eilhardt, Robert ; Zintler, Alexander ; Recalde, Oscar ; Nasiou, Déspina ; Petzold, Stefan ; Alff, Lambert ; Molina-Luna, Leopoldo (2021)
Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors.
In: Microscopy and Microanalysis, 27 (S1)
doi: 10.1017/S1431927621004645
Artikel, Bibliographie

Vogel, Tobias ; Kaiser, Nico ; Petzold, Stefan ; Piros, Eszter ; Guillaume, Nicolas ; Lefevre, Gauthier ; Charpin-Nicolle, Christelle ; David, Sylvain ; Vallee, Christophe ; Nowak, Etienne ; Trautmann, Christina ; Alff, Lambert (2021)
Defect-induced phase transition in hafnium oxide thin films: comparing heavy ion irradiation and oxygen-engineering effects.
In: IEEE Transactions on Nuclear Science, 68 (8)
doi: 10.1109/TNS.2021.3085962
Artikel, Bibliographie

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wengerter, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020)
Neuromorphic Computing: Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11)
doi: 10.1002/aelm.202070044
Artikel, Bibliographie

Piros, Eszter ; Lonsky, Martin ; Petzold, Stefan ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert (2020)
Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy.
In: Physical Review Applied, 14 (3)
doi: 10.1103/PhysRevApplied.14.034029
Artikel, Bibliographie

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020)
Tailoring the Switching Dynamics in Yttrium Oxide-Based RRAM Devices by Oxygen Engineering: From Digital to Multi-Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 2020
doi: 10.1002/aelm.202000439
Artikel, Bibliographie

Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020)
Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11)
doi: 10.1002/aelm.202000439
Artikel, Bibliographie

Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo (2020)
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020
doi: 10.1017/S1431927620019790
Artikel, Bibliographie

Piros, Eszter ; Petzold, Stefan ; Zintler, Alexander ; Kaiser, Nico ; Vogel, Tobias ; Eilhardt, Robert ; Wenger, Christian ; Molina-Luna, Leopoldo ; Alff, Lambert (2020)
Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier.
In: Applied Physics Letters, 117 (1)
doi: 10.1063/5.0009645
Artikel, Bibliographie

Petzold, Stefan (2020)
Defect Engineering in Transition Metal Oxide-based Resistive Random Access Memory.
Technische Universität Darmstadt
doi: 10.25534/tuprints-00011328
Dissertation, Erstveröffentlichung

Petzold, Stefan ; Zintler, Alexander ; Eilhardt, Robert ; Piros, Eszter ; Kaiser, Nico ; Sharath, Sankaramangalam Ulhas ; Vogel, Tobias ; Major, Márton ; McKenna, Keith Patrick ; Molina‐Luna, Leopoldo ; Alff, Lambert (2019)
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices.
In: Advanced Electronic Materials, 5 (10)
doi: 10.1017/S1431927619009942
Artikel, Bibliographie

Petzold, Stefan ; Sharath, S. U. ; Lemke, Jonas ; Hildebrandt, Erwin ; Trautmann, Christina ; Alff, Lambert (2019)
Heavy ion radiation effects on hafnium oxide-based resistive random access memory.
In: IEEE Transactions on Nuclear Science, 66 (7)
doi: 10.1109/TNS.2019.2908637
Artikel, Bibliographie

Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Kaiser, Nico ; Ulhas, Sharath ; Alff, Lambert ; Molina-Luna, Leopoldo (2019)
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Microscopy and Microanalysis, 25 (S2)
doi: 10.1017/S1431927619009942
Artikel, Bibliographie

Niu, Gang ; Calka, Pauline ; Huang, Peng ; Sharath, Sankaramangalam Ulhas ; Petzold, Stefan ; Gloskovskii, Andrei ; Fröhlich, Karol ; Zhao, Yudi ; Kang, Jinfeng ; Schubert, Markus Andreas ; Bärwolf, Florian ; Ren, Wei ; Ye, Zuo-Guang ; Perez, Eduardo ; Wenger, Christian ; Alff, Lambert ; Schroeder, Thomas (2019)
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy.
In: Materials Research Letters, 7 (3)
doi: 10.1080/21663831.2018.1561535
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