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Number of items: 4.

Niu, Gang and Calka, Pauline and Huang, Peng and Sharath, Sankaramangalam Ulhas and Petzold, Stefan and Gloskovskii, Andrei and Fröhlich, Karol and Zhao, Yudi and Kang, Jinfeng and Schubert, Markus Andreas and Bärwolf, Florian and Ren, Wei and Ye, Zuo-Guang and Perez, Eduardo and Wenger, Christian and Alff, Lambert and Schroeder, Thomas (2019):
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy.
In: Materials Research Letters, 7 (3), pp. 117-123. Taylor & Francis Inc., Philadelphia, PA, USA, ISSN 2166-3831,
DOI: 10.1080/21663831.2018.1561535,

Sharath, Sankaramangalam Ulhas and Vogel, Stefan and Molina-Luna, Leopoldo and Hildebrandt, Erwin and Wenger, Christian and Kurian, Jose and Duerrschnabel, Michael and Niermann, Tore and Niu, Gang and Calka, Pauline and Lehmann, Michael and Kleebe, Hans-Joachim and Schroeder, Thomas and Alff, Lambert (2017):
Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfO x based Memristive Devices.
In: Advanced Functional Materials, 27 (32), p. 1700432. WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, ISSN 1616301X,
DOI: 10.1002/adfm.201700432,

Niu, Gang and Calka, Pauline and Auf der Maur, Matthias and Santoni, Francesco and Guha, Subhajit and Fraschke, Mirko and Hamoumou, Philippe and Gautier, Brice and Perez, Eduardo and Walczyk, Christian and Wenger, Christian and Di Carlo, Aldo and Alff, Lambert and Schroeder, Thomas (2016):
Geometric conductive filament confinement by nanotips for resistive switching of HfO2-RRAM devices with high performance.
In: Scientific Reports, 6, p. 25757. NATURE PUBLISHING GROUP, ENGLAND, ISSN 2045-2322,

Niu, Gang and Hildebrandt, Erwin and Schubert, Markus Andreas and Boscherini, Federico and Zoellner, Marvin Hartwig and Alff, Lambert and Walczyk, Damian and Zaumseil, Peter and Costina, Ioan and Wilkens, Henrik and Schroeder, Thomas (2014):
Oxygen Vacancy Induced Room Temperature Ferromagnetism in Pr-Doped CeO2 Thin Films on Silicon.
In: ACS Applied Materials & Interfaces, 6 (20), pp. 17496-17505. ACS Publications, ISSN 1944-8244,

This list was generated on Tue Jan 26 00:12:52 2021 CET.