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Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Zintler, Alexander and Eilhardt, Robert and Wang, Shuai and Krajnak, Matus and Schramowski, Patrick and Stammer, Wolfgang and Petzold, Stefan and Kaiser, Nico and Kerstling, Kristian and Alff, Lambert and Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]

Item Type: Article
Erschienen: 2020
Creators: Zintler, Alexander and Eilhardt, Robert and Wang, Shuai and Krajnak, Matus and Schramowski, Patrick and Stammer, Wolfgang and Petzold, Stefan and Kaiser, Nico and Kerstling, Kristian and Alff, Lambert and Molina-Luna, Leopoldo
Title: Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets
Language: English
Journal or Publication Title: Microscopy and Microanalysis
Journal volume: 2020
Publisher: Cambridge University Press
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
Date Deposited: 12 Aug 2020 08:15
DOI: 10.1017/S1431927620019790
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