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Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]

Item Type: Article
Erschienen: 2020
Creators: Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo
Title: Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets
Language: English
Journal or Publication Title: Microscopy and Microanalysis
Journal volume: 2020
Publisher: Cambridge University Press
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
Date Deposited: 12 Aug 2020 08:15
DOI: 10.1017/S1431927620019790
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