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Zintler, Alexander and Eilhardt, Robert and Wang, Shuai and Krajnak, Matus and Schramowski, Patrick and Stammer, Wolfgang and Petzold, Stefan and Kaiser, Nico and Kerstling, Kristian and Alff, Lambert and Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]

This list was generated on Sat Nov 28 01:02:25 2020 CET.