TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Number of items: 13.

Petzold, Stefan ; Piros, Eszter ; Sharath, Sankaramangalam Ulhas ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, Christian ; Alff, Lambert (2021):
Gradual reset and set characteristics in yttrium oxide based resistive random access memory. (Publisher's Version)
In: Semiconductor Science and Technology, 34 (7), IOP Publishing, ISSN 0268-1242, e-ISSN 1361-6641,
DOI: 10.26083/tuprints-00019328,
[Article]

Petzold, S. ; Piros, E. ; Sharath, S. U. ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, C. ; Alff, Lambert (2019):
Gradual Reset and Set Characteristics in Yttrium Oxide based Resistive Random Access Memory.
In: Semiconductor Science and Technology, ISSN 0268-1242,
DOI: 10.1088/1361-6641/ab220f,
[Article]

Gölden, Dominik ; Zhang, Hongbin ; Radulov, Iliya ; Dirba, Imants ; Komissinskiy, Philipp ; Hildebrandt, Erwin ; Alff, Lambert (2018):
Evolution of anisotropy in bcc Fe distorted by interstitial boron.
In: Physical Review B, 97 (1), APS Publishing, ISSN 2469-9950,
DOI: 10.1103/PhysRevB.97.014411,
[Article]

Sharath, S. U. ; Vogel, S. ; Molina-Luna, Leopoldo ; Hildebrandt, Erwin ; Kurian, J. ; Dürrschnabel, Michael ; Nierman, G. ; Niu, G. ; Calka, P. ; Lehmann, M. ; Kleebe, Hans-Joachim ; Wenger, C. ; Schroeder, T. ; Alff, Lambert (2017):
Control of switching modes and conductance quantization via oxygen engineering in HfOx based memristive devices.
In: Advanced Functional Materirials, 27, p. 1700432. Wiley-VCH Verlag GmbH, Weinheim, DOI: 10.1002/adfm.201700432,
[Article]

Sharath, Sankaramangalam Ulhas ; Vogel, Stefan ; Molina-Luna, Leopoldo ; Hildebrandt, Erwin ; Wenger, Christian ; Kurian, Jose ; Dürrschnabel, Michael ; Niermann, Tore ; Niu, Gang ; Calka, Pauline ; Lehmann, Michael ; Kleebe, Hans-Joachim ; Schroeder, Thomas ; Alff, Lambert (2017):
Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfOx based Memristive Devices.
In: Advanced Functional Materials, 27 (32), p. 1700432. Wiley-VCH Verlag GmbH & Co. KGaA, ISSN 1616-301X,
DOI: 10.1002/adfm.201700432,
[Article]

Hamm, Christin M. ; Gölden, Dominik ; Hildebrandt, Erwin ; Weischenberg, Jürgen ; Zhang, Hongbin ; Alff, Lambert ; Birkel, Christina S. (2016):
Magnetic properties of the Laves-type phases Ti2Co3Si and Ti2Fe3Si and their solid solution.
In: J. Mater. Chem. C, 4 (31), pp. 7430-7435. Royal Society of Chemistry, ISSN 2050-7526,
[Article]

Hildebrandt, Erwin ; Yazdi, Mehrdad Baghaie ; Kurian, Jose ; Sharath, S. U. ; Wilhelm, Fabrice ; Rogalev, Andrei ; Alff, Lambert (2014):
Intrinsic versus extrinsic ferromagnetism in HfO2−x and Ni:HfO2−x thin films.
In: Physical Review B, 90 (13), p. 134426. APS Publications, ISSN 1098-0121,
[Article]

Niu, Gang ; Hildebrandt, Erwin ; Schubert, Markus Andreas ; Boscherini, Federico ; Zoellner, Marvin Hartwig ; Alff, Lambert ; Walczyk, Damian ; Zaumseil, Peter ; Costina, Ioan ; Wilkens, Henrik ; Schroeder, Thomas (2014):
Oxygen Vacancy Induced Room Temperature Ferromagnetism in Pr-Doped CeO2 Thin Films on Silicon.
In: ACS Applied Materials & Interfaces, 6 (20), pp. 17496-17505. ACS Publications, ISSN 1944-8244,
[Article]

Uhlmann, Ina ; Hawelka, Dominik ; Hildebrandt, Erwin ; Pradella, Jens ; Rödel, Jürgen (2013):
Structure and mechanical properties of silica doped zirconia thin films.
In: Thin Solid Films, 527, pp. 200-204. Elsevier Science Publishing, ISSN 00406090,
[Article]

Hildebrandt, Erwin ; Kurian, Jose ; Alff, Lambert (2012):
Physical properties and band structure of reactive molecular beam epitaxy grown oxygen engineered HfO[sub 2±x].
In: Journal of Applied Physics, 112 (11), p. 114112. AIP Publishing LLC, ISSN 00218979,
[Article]

Kayhan, Mehmet ; Hildebrandt, Erwin ; Frotscher, Michael ; Senyshyn, Anatoliy ; Hofmann, Kathrin ; Alff, Lambert ; Albert, Barbara (2012):
Neutron diffraction and observation of superconductivity for tungsten borides, WB and W2B4.
In: Solid State Sciences, 14 (11-12), pp. 1656-1659. Elsevier Science Publishing, ISSN 12932558,
[Article]

Hildebrandt, Erwin ; Kurian, Jose ; Müller, Mathis M. ; Schroeder, Thomas ; Kleebe, Hans-Joachim ; Alff, Lambert (2011):
Controlled oxygen vacancy induced p-type conductivity in HfO2−x thin films.
In: Applied Physics Letters, 99 (11), pp. 112902-112904. ISSN 0003-6951,
DOI: 10.1063/1.3637603,
[Article]

Öksüzoğlu, Ramis Mustafa ; Yıldırım, Mustafa ; Çınar, Hakan ; Hildebrandt, Erwin ; Alff, Lambert (2011):
Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias.
In: Journal of Magnetism and Magnetic Materials, 323 (13), pp. 1827-1834. ISSN 03048853,
[Article]

This list was generated on Tue Oct 19 03:34:54 2021 CEST.