Petzold, Stefan ; Sharath, S. U. ; Lemke, Jonas ; Hildebrandt, Erwin ; Trautmann, Christina ; Alff, Lambert (2019)
Heavy ion radiation effects on hafnium oxide-based resistive random access memory.
In: IEEE Transactions on Nuclear Science, 66 (7)
doi: 10.1109/TNS.2019.2908637
Artikel, Bibliographie

Petzold, S. ; Piros, E. ; Sharath, S. U. ; Zintler, Alexander ; Hildebrandt, Erwin ; Molina-Luna, Leopoldo ; Wenger, C. ; Alff, Lambert (2019)
Gradual Reset and Set Characteristics in Yttrium Oxide based Resistive Random Access Memory.
In: Semiconductor Science and Technology
doi: 10.1088/1361-6641/ab220f
Artikel, Bibliographie

Gölden, Dominik ; Zhang, Hongbin ; Radulov, Iliya ; Dirba, Imants ; Komissinskiy, Philipp ; Hildebrandt, Erwin ; Alff, Lambert (2018)
Evolution of anisotropy in bcc Fe distorted by interstitial boron.
In: Physical Review B, 97 (1)
doi: 10.1103/PhysRevB.97.014411
Artikel, Bibliographie

Sharath, S. U. ; Vogel, S. ; Molina-Luna, Leopoldo ; Hildebrandt, Erwin ; Kurian, J. ; Dürrschnabel, Michael ; Nierman, G. ; Niu, G. ; Calka, P. ; Lehmann, M. ; Kleebe, Hans-Joachim ; Wenger, C. ; Schroeder, T. ; Alff, Lambert (2017)
Control of switching modes and conductance quantization via oxygen engineering in HfOx based memristive devices.
In: Advanced Functional Materirials, 27
doi: 10.1002/adfm.201700432
Artikel, Bibliographie

Sharath, Sankaramangalam Ulhas ; Vogel, Stefan ; Molina-Luna, Leopoldo ; Hildebrandt, Erwin ; Wenger, Christian ; Kurian, Jose ; Dürrschnabel, Michael ; Niermann, Tore ; Niu, Gang ; Calka, Pauline ; Lehmann, Michael ; Kleebe, Hans-Joachim ; Schroeder, Thomas ; Alff, Lambert (2017)
Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfOx based Memristive Devices.
In: Advanced Functional Materials, 27 (32)
doi: 10.1002/adfm.201700432
Artikel, Bibliographie

Hamm, Christin M. ; Gölden, Dominik ; Hildebrandt, Erwin ; Weischenberg, Jürgen ; Zhang, Hongbin ; Alff, Lambert ; Birkel, Christina S. (2016)
Magnetic properties of the Laves-type phases Ti2Co3Si and Ti2Fe3Si and their solid solution.
In: J. Mater. Chem. C, 4 (31)
doi: 10.1039/c6tc02043g
Artikel, Bibliographie

Hildebrandt, Erwin ; Yazdi, Mehrdad Baghaie ; Kurian, Jose ; Sharath, S. U. ; Wilhelm, Fabrice ; Rogalev, Andrei ; Alff, Lambert (2014)
Intrinsic versus extrinsic ferromagnetism in HfO2−x and Ni:HfO2−x thin films.
In: Physical Review B, 90 (13)
doi: 10.1103/PhysRevB.90.134426
Artikel, Bibliographie

Niu, Gang ; Hildebrandt, Erwin ; Schubert, Markus Andreas ; Boscherini, Federico ; Zoellner, Marvin Hartwig ; Alff, Lambert ; Walczyk, Damian ; Zaumseil, Peter ; Costina, Ioan ; Wilkens, Henrik ; Schroeder, Thomas (2014)
Oxygen Vacancy Induced Room Temperature Ferromagnetism in Pr-Doped CeO2 Thin Films on Silicon.
In: ACS Applied Materials & Interfaces, 6 (20)
doi: 10.1021/am502238w
Artikel, Bibliographie

Uhlmann, Ina ; Hawelka, Dominik ; Hildebrandt, Erwin ; Pradella, Jens ; Rödel, Jürgen (2013)
Structure and mechanical properties of silica doped zirconia thin films.
In: Thin Solid Films, 527
doi: 10.1016/j.tsf.2012.08.007
Artikel, Bibliographie

Hildebrandt, Erwin ; Kurian, Jose ; Alff, Lambert (2012)
Physical properties and band structure of reactive molecular beam epitaxy grown oxygen engineered HfO[sub 2±x].
In: Journal of Applied Physics, 112 (11)
doi: 10.1063/1.4767379
Artikel, Bibliographie

Kayhan, Mehmet ; Hildebrandt, Erwin ; Frotscher, Michael ; Senyshyn, Anatoliy ; Hofmann, Kathrin ; Alff, Lambert ; Albert, Barbara (2012)
Neutron diffraction and observation of superconductivity for tungsten borides, WB and W2B4.
In: Solid State Sciences, 14 (11-12)
doi: 10.1016/j.solidstatesciences.2012.05.036
Artikel, Bibliographie

Hildebrandt, Erwin ; Kurian, Jose ; Müller, Mathis M. ; Schroeder, Thomas ; Kleebe, Hans-Joachim ; Alff, Lambert (2011)
Controlled oxygen vacancy induced p-type conductivity in HfO2−x thin films.
In: Applied Physics Letters, 99 (11)
doi: 10.1063/1.3637603
Artikel, Bibliographie

Öksüzoğlu, Ramis Mustafa ; Yıldırım, Mustafa ; Çınar, Hakan ; Hildebrandt, Erwin ; Alff, Lambert (2011)
Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias.
In: Journal of Magnetism and Magnetic Materials, 323 (13)
doi: 10.1016/j.jmmm.2011.02.021
Artikel, Bibliographie