Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Ulhas, Sharath ; Bruder, Enrico ; Kaiser, Nico ; Alff, Lambert ; Molina-Luna, Leopoldo (2022):
Enhanced Conductivity and Microstructure in Highly Textured TiN1−x/c‑Al2O3 Thin Films.
In: ACS Omega, 2022, pp. 1-8. ACS Publications, ISSN 2470-1343,
DOI: 10.1021/acsomega.1c05505,
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Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Sharath, Sankaramangalam Ulhas ; Bruder, Enrico ; Kaiser, Nico ; Alff, Lambert ; Molina-Luna, Leopoldo (2022):
Enhanced Conductivity and Microstructure in Highly Textured TiN1–x/c-Al2O3 Thin Films. (Publisher's Version)
In: ACS Omega, 7 (2), pp. 2041-2048. ACS Publications, ISSN 2470-1343,
DOI: 10.26083/tuprints-00021222,
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Kaiser, Nico ; Vogel, Tobias ; Zintler, Alexander ; Petzold, Stefan ; Arzumanov, Alexey ; Piros, Eszter ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Alff, Lambert (2021):
Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties.
In: ACS Applied Materials & Interfaces, 2021, pp. 1-14. American Chemical Society, ISSN 1944-8244,
DOI: 10.1021/acsami.1c09451,
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Eilhardt, Robert ; Zintler, Alexander ; Recalde, Oscar ; Nasiou, Déspina ; Petzold, Stefan ; Alff, Lambert ; Molina-Luna, Leopoldo (2021):
Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors.
In: Microscopy and Microanalysis, 27 (S1), pp. 1238-1239. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927621004645,
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Sharma, Shalini ; Zintler, Alexander ; Günzing, Damian ; Lill, Johanna ; Motta Meira, Debora ; Eilhardt, Robert ; Singh, Harish K. ; Xie, Ruiwen ; Gkouzia, Georgia ; Major, Márton ; Radulov, Iliya ; Kommissinskiy, Philipp ; Zhang, Hongbin ; Skokov, Konstantin ; Wende, Heiko ; Takahashi, Y. ; Ollefs, Katharina ; Molina-Luna, Leopoldo ; Alff, Lambert (2021):
Epitaxy Induced Highly Ordered Sm2Co17–SmCo5 Nanoscale Thin-Film Magnets.
In: ACS Applied Materials & Interfaces, 13 (27), pp. 32415-32423. ACS Publications, ISSN 1944-8244,
DOI: 10.1021/acsami.1c04780,
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Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wengerter, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Neuromorphic Computing: Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2070044. Wiley, ISSN 2199160X,
DOI: 10.1002/aelm.202070044,
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Piros, Eszter ; Lonsky, Martin ; Petzold, Stefan ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert (2020):
Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy.
In: Physical Review Applied, 14 (3), pp. 034029. American Physical Society, ISSN 2331-7019,
DOI: 10.1103/PhysRevApplied.14.034029,
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Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide-Based RRAM Devices by Oxygen Engineering: From Digital to Multi-Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 2020, Wiley, ISSN 2199-160X,
DOI: 10.1002/aelm.202000439,
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Petzold, Stefan ; Piros, Eszter ; Eilhardt, Robert ; Zintler, Alexander ; Vogel, Tobias ; Kaiser, Nico ; Radetinac, Aldin ; Komissinskiy, Philipp ; Jalaguier, Eric ; Nolot, Emmanuel ; Charpin-Nicolle, Christelle ; Wenger, Christian ; Molina-Luna, Leopoldo ; Miranda, Enrique ; Alff, Lambert (2020):
Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching.
In: Advanced Electronic Materials, 6 (11), p. 2000439. Wiley, ISSN 2199-160X,
DOI: 10.1002/aelm.202000439,
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Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
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Krajnak, Matus ; Blazit, Jean-Denis ; Zintler, Alexander ; Eilhardt, Robert ; Weiss, Jon ; Cosart, Doug ; Molina-Luna, Leopoldo ; Tencé, Marcel ; Gloter, Alexandre ; Allen, Christopher ; McGrouther, Damien (2020):
Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019893,
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Piros, Eszter ; Petzold, Stefan ; Zintler, Alexander ; Kaiser, Nico ; Vogel, Tobias ; Eilhardt, Robert ; Wenger, Christian ; Molina-Luna, Leopoldo ; Alff, Lambert (2020):
Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier.
In: Applied Physics Letters, 117 (1), pp. 013504. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/5.0009645,
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Cherkashinin, Gennady ; Yu, Zhihang ; Eilhardt, Robert ; Alff, Lambert ; Jaegermann, Wolfram (2020):
The Effect of Interfacial Charge Distribution on Chemical Compatibility and Stability of the High Voltage Electrodes (LiCoPO 4 , LiNiPO 4 )/Solid Electrolyte (LiPON) Interface.
In: Advanced Materials Interfaces, 7 (12), p. 2000276. Wiley, ISSN 2196-7350,
DOI: 10.1002/admi.202000276,
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Piros, Eszter ; Lonsky, Martin ; Petzold, Martin ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert (2020):
Role of oxygen defects in forming conductive filaments in Y2O3-based analog RRAM devices as revealed by fluctuation spectroscopy.
In: Physical Review Applied, APS Publishing, ISSN 2331-7019,
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Petzold, S. ; Zintler, Alexander ; Eilhardt, Robert ; Piros, E. ; Kaiser, N. ; Sharath, S. U. ; Vogel, T. ; Major, M. ; McKenna, K. P. ; Molina-Luna, Leopoldo ; Alff, Lambert (2019):
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices.
In: Advanced Electronic Materials, 25 (S2), pp. 1842-1843. WILEY, ISSN 2199160X,
DOI: 10.1017/S1431927619009942,
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Petzold, S. ; Miranda, E. ; Sharath, S.U. ; Munos-Gorriz, J. ; Vogel, T. ; Piros, E. ; Kaiser, N. ; Eilhardt, Robert ; Zintler, Alexander ; Molina-Luna, Leopoldo ; Sune, J. ; Alff, Lambert (2019):
Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
In: Journal of Applied Physics, (125), p. 234503. ISSN 00218979,
DOI: 10.1063/1.5094864,
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Zintler, Alexander ; Eilhardt, Robert ; Petzold, S. ; Kaiser, N. ; Ulhas, S. ; Alff, Lambert ; Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Proceedings of Microscopy & Microanalysis, 25 (S2), pp. 1842-1843. Microscopy Society of America, DOI: 10.1017/S1431927619009942,
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Zintler, Alexander ; Eilhardt, Robert ; Petzold, Stefan ; Kaiser, Nico ; Ulhas, Sharath ; Alff, Lambert ; Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
In: Microscopy and Microanalysis, 25 (S2), pp. 1842-1843. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619009942,
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Cherkashinin, Gennady ; Eilhardt, Robert ; Lebedev, Mikhail V. ; Nappini, Silvia ; Magnano, Elena ; Jaegermann, Wolfram (2018):
Olivine-LiNiPO 4 Thin Films: Chemical Compatibility with Liquid Electrolyte and Interface Stability at High Potential.
In: Journal of The Electrochemical Society, 165 (4), pp. H3143-H3147. ISSN 0013-4651,
DOI: 10.1149/2.0211804jes,
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