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Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation

Zintler, Alexander and Eilhardt, Robert and Petzold, S. and Kaiser, N. and Ulhas, S. and Alff, Lambert and Molina-Luna, Leopoldo (2019):
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation.
25, In: Proceedings of Microscopy & Microanalysis, (S2), pp. 1842-1843. Microscopy Society of America, DOI: 10.1017/S1431927619009942,
[Article]

Item Type: Article
Erschienen: 2019
Creators: Zintler, Alexander and Eilhardt, Robert and Petzold, S. and Kaiser, N. and Ulhas, S. and Alff, Lambert and Molina-Luna, Leopoldo
Title: Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation
Language: English
Journal or Publication Title: Proceedings of Microscopy & Microanalysis
Volume: 25
Number: S2
Publisher: Microscopy Society of America
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
Date Deposited: 14 Aug 2019 12:58
DOI: 10.1017/S1431927619009942
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