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Number of items: 47.

Wieder, Thomas (2014):
A toy model for hostility between two populations in dependency on their internal frustration.
In: International Mathematical Forum, 9 (32), pp. 1581-1593. Hikari Ltd., ISSN 1314-7536,

Wieder, Thomas (2013):
On the use of strategies attached to subpopulations in the description of competition among different populations.
In: International Mathematical Forum, 8 (37), pp. 1839-1851. HIKARI Ltd, [Article]

Wieder, Thomas (2012):
Addendum to "A simple differential equation system for the description of competition among religions”.
In: International Mathematical Forum, 7 (54), pp. 2681-2686. Hikari Ltd, ISSN 1312-7594,

Wieder, Thomas (2012):
The Debye scattering formula in n dimensions.
In: Journal of Mathematical and Computational Science, 2 (4), pp. 1086-1090. SCIK, ISSN 1927-5307,

Wieder, Thomas (2011):
Generation of all possible multiselections from a multiset.
In: Progress in Applied Mathematics, 2 (1), pp. 61-66. CSCanada, ISSN 1925-2528,

Wieder, Thomas (2011):
A simple differential equation system for the description of competition among religions.
In: International Mathematical Forum, 6, pp. 1713-1723. HIKARI, [Article]

Wieder, Thomas (2009):
The number of certain rankings and hierarchies formed from labeled or unlabeled elements and sets.
In: Applied matheamtical sciences, 3 (55), pp. 2707-2724. HIKARI, [Article]

Wieder, Thomas (2008):
The number of certain k-combinations of an n-set.
In: Applied Mathematical E-Notes, 8, pp. 45-52. Department of Mathematics, Tsing Hua University, Hsinchu, Taiwan, ISSN ISSN 1607-2510,

Wali, Y. ; Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. (2007):
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, 40 (7), pp. 545-551. ELSEVIER, ISSN 0963-8695,

Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. ; Fuess, Hartmut (2004):
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, 52, pp. 135-143. [Article]

Hohl, Achim ; Wieder, Thomas ; Aken, Peter A. van ; Weirich, Th. E. ; Denninger, G. ; Vidal, M. ; Oswald, S. ; Deneke, C. ; Mayer, J. ; Fuess, Hartmut (2003):
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO).
In: Journal of non-crystalline solids, 320 (1-3), pp. 255-280. Elsevier, ISSN 0022-3093, e-ISSN 1873-4812,
DOI: 10.1016/S0022-3093(03)00031-0,

Schubert, Ulrich ; Wieder, Thomas
Schubert, Ulrich ; Jutzi, Peter (eds.) (2003):
Ein Strukturmodell des amorphen SiO.
In: Silicon Chemistry, Weinheim, Wiley-VCH, ISBN 3-527-30647-1,
[Book Section]

Hoelzel, Markus ; Danilkin, S. A. ; Hoser, A. ; Ehrenberg, Helmut ; Wieder, Thomas ; Fuess, Hartmut (2002):
Phonon dispersion in austenitic stainless steel Fe-18Cr-12Ni-2Mo.
In: Applied physics / A, 74, pp. 1013-1015. [Article]

Njeh, Anouar ; Wieder, Thomas ; Fuess, Hartmut (2002):
Reflectometry studies of the oxidation kinetics of thin copper films.
In: Surface and interface analysis, 33, pp. 626-628. [Article]

Njeh, Anouar ; Wieder, Thomas ; Schneider, D. ; Fuess, Hartmut ; Ben Ghozlen, M. H. (2002):
Surface wave propagation in thin silver films under residual stress.
In: Zeitschrift für Naturforschung / A, 57, pp. 58-64. [Article]

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. (2001):
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
In: Journal of Crystal Growth, 227-228, pp. 625-629. Elsevier, ISSN 0022-0248,
DOI: 10.1016/S0022-0248(01)00785-0,

Schreiber, Jürgen ; Neubrand, Achim ; Wieder, Thomas ; Schamsutdinov, Nail (2001):
Distribution of Macro- and Micro-Stresses in W-CuFGM.
In: Functionally Graded Materials 2000, 114, pp. 603-610. ISSN 1042- 1122,

Danilkin, S. A. ; Fuess, Hartmut ; Wieder, Thomas ; Hoser, A. (2001):
Phonon dispersion and elastic constants in Fe-Cr-Mn-Ni austenitic steel;.
In: Journal of Materials Science, 36 (4), pp. 811-814. ISSN 00222461,

Wieder, Thomas (2000):
On the strain-free lattice constants in residual stress evaluation by diffraction.
In: Journal of structural geology, 22 (11-12), pp. 1601-1607. Elsevier, ISSN 0191-8141, e-ISSN 1873-1201,
DOI: 10.1016/S0191-8141(00)00111-5,

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. (2000):
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts.
In: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275, [Conference or Workshop Item]

Njeh, Anouar ; Wieder, Thomas ; Fuess, H. (2000):
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
In: Powder diffraction, 15, pp. 211-216. [Article]

Beskrovni, A. ; Danilkin, S. ; Fuess, H. ; Jadrowski, E. ; Neova-Baeva, M. ; Wieder, Thomas (1999):
Effect of Cr content on the crystal structure and lattice dynamics of FCCFe-Cr-Ni-N austenitic alloys.
In: Journal of alloys and compounds, 291, pp. 262-268. [Article]

Wieder, Thomas (1999):
Numerical Hankel transform by the Fortran program HANKEL.
In: Transactions on mathematical software, 25, pp. 240-250. [Article]

Wieder, Thomas (1999):
Rietveld-Analyse amorpher Strukturen.
In: Deutsche Gesellschaft für Kristallographie / Arbeitskreis Nicht-kristalline und partiellkristalline Strukturen: Tagung <20, 1999, Wolfersdorf, Jena>; Tagungsbd., [Conference or Workshop Item]

Wieder, Thomas ; Neubrand, A. ; Fuess, H. ; Pirling, T. (1999):
Yield stress increase in a W/Cu composite observed by neutron diffraction.
In: Journal of materials science letters, 18, pp. 1135-1137. [Article]

Wieder, Thomas (1999):
A generalized Debye scattering formula and the Hankel transform.
In: Zeitschrift für Naturforschung. Sect. A: Journal of physical sciences, 54, pp. 124-130. [Article]

Danilkin, S. ; Fuess, H. ; Wieder, Thomas ; Wipf, H. (1998):
X-ray and neutron scattering study of Nb-O solid solutions.
In: Journal of alloys and compounds. 266 (1998), S. 230-233, [Article]

Wieder, Thomas ; Fuess, Hartmut (1998):
On the generalized Debye scattering equation.
In: Materials Science Forum, 278-28, In: EPDIC 5, pp. 100-105, Schweiz, [Book Section]

Wieder, Thomas ; Fuess, H. (1997):
A generalized Debye scattering equation.
In: Zeitschrift für Naturforschung. 52 a (1997), S. 386-392, [Article]

Wieder, Thomas (1996):
Realstrukturaufklärung polykristalliner dünner Schichten mittels Röntgenbeugung.
Darmstadt: 1996. XI, 389 S., Darmstadt, Technische Univ. Darmstadt, [Habilitation]

Wieder, Thomas (1996):
Simultaneous determination of the strain/stress tensor and the un-strained lattice constants by X-ray diffraction.
In: Applied physics letters. 69 (1996), [Article]

Wieder, Thomas (1996):
WVM: a computer program for the determination of lattice constants and strains in thin films.
In: Computer physics communications. 96 (1996), S. 53-60, [Article]

Wieder, Thomas (1995):
Calculation of thermally induced strains in thin films of any crystal class.
In: Journal of Applied Physics, 78 (2), pp. 838-841. ISSN 00218979,

Zendehroud, Jafar ; Wieder, Thomas ; Klein, Helmut (1995):
Determination of Stress Tensors in thin textured copper films by grazing incidence diffraction.
In: Materialwissenschaft und Werkstofftechnik, 26 (10), pp. 553-559. ISSN 09335137,

Zendehroud, Jafar ; Wieder, Thomas ; Thoma, Klaus (1995):
Gitterkonstantenbestimmung in kubischen dünnen Schichten unter thermischer Dehnung.
In: Materialwissenschaft und Werkstofftechnik, 26 (7), pp. 386-393. ISSN 09335137,

Wieder, Thomas (1995):
Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strain.
In: Thin Solid Films, 256 (1-2), pp. 39-43. ISSN 00406090,

Wieder, Thomas (1995):
SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions.
In: Computer Physics Communications, 85 (3), pp. 398-414. ISSN 00104655,

Kimmel, Giora ; Politi, L. ; Wieder, Thomas (1994):
Characterization of (Ti,Al)N Films by XRD and XRF.
In: Advances of X-Ray Analysis, 37, pp. 175-183. [Article]

Levin, Igor ; Kaplan, Wayne David ; Wieder, Thomas ; Brandon, David (1994):
Residual stresses in alumina-SiC nanocomposites.
In: Acta Metallurgica et Materialia, 42 (4), pp. 1147-1154. ISSN 09567151,

Wieder, Thomas (1993):
SBGBBG: A Computer Program For Strain/Stress Tensor Calculation From X-Ray Diffraction Data.
In: Powder Diffraction, 8, pp. 214-215. [Article]

Zendehroud, Jafar ; Wieder, Thomas (1993):
Tiefenauflösende röntgenographische Dehnungsmessungen an TiN-Schichten in Seemann-Bohlin-Geometrie.
In: Härterei-Technische Mitteilungen, 48, pp. 41-49. [Article]

Wieder, Thomas (1991):
Berechnung des (420)-Reflexprofiles einer γ′-Fe4N(1−x)-Schicht mit Säulenstruktur und Dehnungsrelaxation.
In: Materialwissenschaft und Werkstofftechnik, 22 (1), pp. 23-30. ISSN 09335137,

Gartner, Helmut ; Thoma, Klaus ; Volkmann, H. ; Wieder, Thomas ; Schmitt, A. (1991):
High-energy implantation of Kr+ into Ti.
In: International Journal of Radiation Applications and Instrumentation Part D Nuclear Tracks and Radiation Measurements, 19 (1-4), pp. 885-890. ISSN 13590189,

Siejkowski, Waldemar ; Calderero-Lopez, A. ; Wieder, Thomas ; Gärtner, Helmut (1991):
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films.
In: Metalurgia I Odlewnictwo, 17, pp. 427-437. [Article]

Wieder, Thomas ; Herr, W. ; Gärtner, Helmut (1989):
Berechnung von Röntgenreflexen für polykristallines Titan unter dem Einfluß von Stickstoffgradienten und Eigenspannungen.
In: Materialwissenschaft und Werkstofftechnik, 20 (8), pp. 271-277. ISSN 09335137,

Wieder, Thomas ; Thoma, Klaus ; Gärtner, Helmut (1988):
New scattering formula for the analysis of X-ray line broadening by composition profiles.
In: Applied Physics A Solids and Surfaces, 46 (3), p. 165. ISSN 09478396,

Thoma, Klaus ; Färber, R. ; Wieder, Thomas ; Gärtner, Helmut (1987):
Structure and fatigue properties of ion-plated Nickel films on steel.
In: Materials Science and Engineering, 90, pp. 327-332. ISSN 00255416,

This list was generated on Sat Nov 26 02:57:52 2022 CET.