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Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts

Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H. (2001):
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
In: Journal of crystal growth, pp. 625-629, 227-22, [Article]

Item Type: Article
Erschienen: 2001
Creators: Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H.
Title: Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts
Language: English
Journal or Publication Title: Journal of crystal growth
Volume: 227-22
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:28
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