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Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. (2001):
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
227-228, In: Journal of Crystal Growth, pp. 625-629. Elsevier, ISSN 0022-0248,
DOI: 10.1016/S0022-0248(01)00785-0,
[Article]

Item Type: Article
Erschienen: 2001
Creators: Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H.
Title: Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts
Language: English
Journal or Publication Title: Journal of Crystal Growth
Volume: 227-228
Publisher: Elsevier
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:28
DOI: 10.1016/S0022-0248(01)00785-0
License: [undefiniert]
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