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Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts

Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H. (2000):
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts.
In: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H.
Title: Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts
Language: English
Series Name: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:25
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