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Wali, Y. and Njeh, Anouar and Wieder, Thomas and Ben Ghozlen, M. H. (2007):
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, (7), 40. ELSEVIER, pp. 545-551, ISSN 0963-8695,
[Online-Edition: http://dx.doi.org/10.1016/j.ndteint.2007.02.004],

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