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New scattering formula for the analysis of X-ray line broadening by composition profiles

Wieder, Thomas and Thoma, Klaus and Gärtner, Helmut (1988):
New scattering formula for the analysis of X-ray line broadening by composition profiles.
46, In: Applied Physics A Solids and Surfaces, (3), p. 165, ISSN 09478396, [Online-Edition: http://dx.doi.org/10.1007/BF00939259],
[Article]

Item Type: Article
Erschienen: 1988
Creators: Wieder, Thomas and Thoma, Klaus and Gärtner, Helmut
Title: New scattering formula for the analysis of X-ray line broadening by composition profiles
Language: English
Journal or Publication Title: Applied Physics A Solids and Surfaces
Volume: 46
Number: 3
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Structure Research
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 14 Sep 2009 06:54
Official URL: http://dx.doi.org/10.1007/BF00939259
Identification Number: doi:10.1007/BF00939259
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