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Number of items: 3.

Sternemann, C. and Soininen, J. A. and Volmer, M. and Hohl, Achim and Vankó, G. and Streit, S. and Tolan, M. (2005):
X-ray Raman scattering at the Si L II,III-edge of bulk amorphous SiO.
In: Journal of physics and chemistry of solids, 66. pp. 2277-2280, [Article]

Hohl, Achim (2003):
Untersuchungen zur Struktur von amorphem Siliziummonoxid.
Darmstadt, Technische Universität, TU Darmstadt, [Online-Edition: urn:nbn:de:tuda-tuprints-3217],
[Ph.D. Thesis]

Hohl, Achim and Wieder, Thomas and Aken, Peter A. van and Weirich, Th. E. and Denninger, G. and Vidal, M. and Oswald, S. and Deneke, C. and Mayer, J. and Fuess, Hartmut (2003):
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO).
In: Journal of non-crystalline solids, 320pp. 255-280, [Article]

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