Takali, Farid ; Msedi, Souhir ; Othmani, Cherif ; Njeh, Anouar ; Donner, Wolfgang ; Ghozlen, Mohamed Hedi Ben (2019)
Acousto-elastic theory for the coupling parameters in terms of nonlinear elastic, piezoelectric, electrostrictive, and dielectric constants in trigonal and hexagonal crystalline systems: applied in the crystal and solid-state physics.
In: Acta Mechanica, 230 (3)
doi: 10.1007/s00707-018-2316-y
Artikel, Bibliographie

Mseddi, Souhir ; Donner, Wolfgang ; Klein, Andreas ; Njeh, Anouar (2018)
Residual stress effect on coupling electromechanical factor of epitaxial Barium Strontium Titanate (BST) thin films.
In: Mechanics Research Communications, 87
doi: 10.1016/j.mechrescom.2017.12.001
Artikel, Bibliographie

Chaabani, Anouar ; Njeh, Anouar ; Donner, Wolfgang ; Klein, Andreas ; Ben Ghozlen, Mohamed Hédi (2017)
Elasticity study of textured barium strontium titanate thin films by X-ray diffraction and laser acoustic waves.
In: Japanese Journal of Applied Physics, 56 (5)
doi: 10.7567/JJAP.56.055501
Artikel, Bibliographie

Kamel, Marwa ; Mseddi, Souhir ; Njeh, Anouar ; Donner, Wolfgang ; Ben Ghozlen, Mohamed Hédi (2015)
Acoustoelastic effect of textured (Ba,Sr)TiO3 thin films under an initial mechanical stress.
In: Journal of Applied Physics, 118 (22)
doi: 10.1063/1.4936784
Artikel, Bibliographie

Wali, Y. ; Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. (2007)
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, 40 (7)
doi: 10.1016/j.ndteint.2007.02.004
Artikel, Bibliographie

Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. ; Fuess, Hartmut (2004)
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, 52
Artikel, Bibliographie

Njeh, Anouar (2002)
Caractéristiques structurales et élastiques des couches minces Ag/Si et Cu/Si.
Technische Universität Darmstadt
Dissertation, Bibliographie

Njeh, Anouar ; Wieder, Thomas ; Fuess, Hartmut (2002)
Reflectometry studies of the oxidation kinetics of thin copper films.
In: Surface and interface analysis, 33
Artikel, Bibliographie

Njeh, Anouar ; Wieder, Thomas ; Schneider, D. ; Fuess, Hartmut ; Ben Ghozlen, M. H. (2002)
Surface wave propagation in thin silver films under residual stress.
In: Zeitschrift für Naturforschung / A, 57
Artikel, Bibliographie

Njeh, Anouar ; Wieder, Thomas ; Fuess, H. (2000)
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
In: Powder diffraction, 15
Artikel, Bibliographie