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Number of items: 10.

Takali, Farid ; Msedi, Souhir ; Othmani, Cherif ; Njeh, Anouar ; Donner, Wolfgang ; Ghozlen, Mohamed Hedi Ben (2019):
Acousto-elastic theory for the coupling parameters in terms of nonlinear elastic, piezoelectric, electrostrictive, and dielectric constants in trigonal and hexagonal crystalline systems: applied in the crystal and solid-state physics.
In: Acta Mechanica, 230 (3), pp. 1027-1035. Springer, ISSN 0001-5970,
DOI: 10.1007/s00707-018-2316-y,

Mseddi, Souhir ; Donner, Wolfgang ; Klein, Andreas ; Njeh, Anouar (2018):
Residual stress effect on coupling electromechanical factor of epitaxial Barium Strontium Titanate (BST) thin films.
In: Mechanics Research Communications, 87, pp. 13-20. ISSN 00936413,
DOI: 10.1016/j.mechrescom.2017.12.001,

Chaabani, Anouar ; Njeh, Anouar ; Donner, Wolfgang ; Klein, Andreas ; Ben Ghozlen, Mohamed Hédi (2017):
Elasticity study of textured barium strontium titanate thin films by X-ray diffraction and laser acoustic waves.
In: Japanese Journal of Applied Physics, 56 (5), pp. 055501. IOP Publishing, ISSN 0021-4922,
DOI: 10.7567/JJAP.56.055501,

Kamel, Marwa ; Mseddi, Souhir ; Njeh, Anouar ; Donner, Wolfgang ; Ben Ghozlen, Mohamed Hédi (2015):
Acoustoelastic effect of textured (Ba,Sr)TiO3 thin films under an initial mechanical stress.
In: Journal of Applied Physics, 118 (22), p. 225305. American Institute of Physics, ISSN 0021-8979,

Wali, Y. ; Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. (2007):
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, 40 (7), pp. 545-551. ELSEVIER, ISSN 0963-8695,

Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. ; Fuess, Hartmut (2004):
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, 52, pp. 135-143. [Article]

Njeh, Anouar (2002):
Caractéristiques structurales et élastiques des couches minces Ag/Si et Cu/Si.
Sfax, Tun., Univ., TU Darmstadt,
[Ph.D. Thesis]

Njeh, Anouar ; Wieder, Thomas ; Fuess, Hartmut (2002):
Reflectometry studies of the oxidation kinetics of thin copper films.
33, In: Surface and interface analysis, pp. 626-628. [Article]

Njeh, Anouar ; Wieder, Thomas ; Schneider, D. ; Fuess, Hartmut ; Ben Ghozlen, M. H. (2002):
Surface wave propagation in thin silver films under residual stress.
57, In: Zeitschrift für Naturforschung / A, pp. 58-64. [Article]

Njeh, Anouar ; Wieder, Thomas ; Fuess, H. (2000):
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
In: Powder diffraction, 15, pp. 211-216. [Article]

This list was generated on Tue Dec 7 08:35:40 2021 CET.