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Reflectometry studies of the oxidation kinetics of thin copper films

Njeh, Anouar and Wieder, Thomas and Fuess, Hartmut (2002):
Reflectometry studies of the oxidation kinetics of thin copper films.
In: Surface and interface analysis, 33pp. 626-628, [Article]

Item Type: Article
Erschienen: 2002
Creators: Njeh, Anouar and Wieder, Thomas and Fuess, Hartmut
Title: Reflectometry studies of the oxidation kinetics of thin copper films
Language: English
Journal or Publication Title: Surface and interface analysis
Volume: 33
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
Date Deposited: 19 Nov 2008 16:29
License: [undefiniert]
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