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Anzahl der Einträge: 47.

Wieder, Thomas :
A toy model for hostility between two populations in dependency on their internal frustration.
[Online-Edition: http://www.m-hikari.com/imf.html]
In: International Mathematical Forum, 9 (32) pp. 1581-1593. ISSN 1314-7536
[Artikel], (2014)

Wieder, Thomas :
On the use of strategies attached to subpopulations in the description of competition among different populations.
[Online-Edition: http://www.m-hikari.com/]
In: International Mathematical Forum, 8 (37) pp. 1839-1851.
[Artikel], (2013)

Wieder, Thomas :
Addendum to "A simple differential equation system for the description of competition among religions”.
[Online-Edition: http://www.m-hikari.com/imf.html]
In: International Mathematical Forum, 7 (54) pp. 2681-2686. ISSN 1312-7594
[Artikel], (2012)

Wieder, Thomas :
The Debye scattering formula in n dimensions.
[Online-Edition: http://scik.org/index.php/jmcs/]
In: Journal of Mathematical and Computational Science, 2 (4) pp. 1086-1090. ISSN 1927-5307
[Artikel], (2012)

Wieder, Thomas :
Generation of all possible multiselections from a multiset.
[Online-Edition: http://www.cscanada.net/index.php/pam/index]
In: Progress in Applied Mathematics, 2 (1) pp. 61-66. ISSN 1925-2528
[Artikel], (2011)

Wieder, Thomas :
A simple differential equation system for the description of competition among religions.
[Online-Edition: http://www.m-hikari.com/index.html]
In: International Mathematical Forum, 6 pp. 1713-1723.
[Artikel], (2011)

Wieder, Thomas :
The number of certain rankings and hierarchies formed from labeled or unlabeled elements and sets.
[Online-Edition: http://www.m-hikari.com/ams/index.html]
In: Applied matheamtical sciences, 3 (55) pp. 2707-2724.
[Artikel], (2009)

Wieder, Thomas :
The number of certain k-combinations of an n-set.
[Online-Edition: http://www.math.nthu.edu.tw/~amen/]
In: Applied Mathematical E-Notes, 8 pp. 45-52. ISSN ISSN 1607-2510
[Artikel], (2008)

Wali, Y. ; Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. :
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
[Online-Edition: http://dx.doi.org/10.1016/j.ndteint.2007.02.004]
In: NDT and E International, 40 (7) pp. 545-551. ISSN 0963-8695
[Artikel], (2007)

Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. ; Fuess, Hartmut :
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, 52 pp. 135-143.
[Artikel], (2004)

Hohl, Achim ; Wieder, Thomas ; Aken, Peter A. van ; Weirich, Th. E. ; Denninger, G. ; Vidal, M. ; Oswald, S. ; Deneke, C. ; Mayer, J. ; Fuess, Hartmut :
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO).
In: Journal of non-crystalline solids, 320 pp. 255-280.
[Artikel], (2003)

Schubert, Ulrich ; Wieder, Thomas
Schubert, Ulrich ; Jutzi, Peter (eds.) :

Ein Strukturmodell des amorphen SiO.
In: Silicon Chemistry. Wiley-VCH, Weinheim ISBN 3-527-30647-1
[Buchkapitel], (2003)

Hoelzel, Markus ; Danilkin, S. A. ; Hoser, A. ; Ehrenberg, Helmut ; Wieder, Thomas ; Fuess, Hartmut :
Phonon dispersion in austenitic stainless steel Fe-18Cr-12Ni-2Mo.
In: Applied physics / A, 74 pp. 1013-1015.
[Artikel], (2002)

Njeh, Anouar ; Wieder, Thomas ; Fuess, Hartmut :
Reflectometry studies of the oxidation kinetics of thin copper films.
In: Surface and interface analysis, 33 pp. 626-628.
[Artikel], (2002)

Njeh, Anouar ; Wieder, Thomas ; Schneider, D. ; Fuess, Hartmut ; Ben Ghozlen, M. H. :
Surface wave propagation in thin silver films under residual stress.
In: Zeitschrift für Naturforschung / A, 57 pp. 58-64.
[Artikel], (2002)

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. :
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
In: Journal of crystal growth, 227-22 pp. 625-629.
[Artikel], (2001)

Schreiber, Jürgen ; Neubrand, Achim ; Wieder, Thomas ; Schamsutdinov, Nail :
Distribution of Macro- and Micro-Stresses in W-CuFGM.
In: Functionally Graded Materials 2000, 114 pp. 603-610. ISSN 1042- 1122
[Artikel], (2001)

Danilkin, S. A. ; Fuess, Hartmut ; Wieder, Thomas ; Hoser, A. :
Phonon dispersion and elastic constants in Fe-Cr-Mn-Ni austenitic steel;.
[Online-Edition: http://dx.doi.org/10.1023/A:1004801823614]
In: Journal of Materials Science, 36 (4) pp. 811-814. ISSN 00222461
[Artikel], (2001)

Njeh, Anouar ; Wieder, Thomas ; Fuess, H. :
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
In: Powder diffraction, 15 pp. 211-216.
[Artikel], (2000)

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. :
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts.
In: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275 .
[Konferenz- oder Workshop-Beitrag], (2000)

Wieder, Thomas :
On the strain-free lattice constants in residual stress evaluation by diffraction.
In: Journal of structural geology, 22 pp. 1601-1607.
[Artikel], (2000)

Beskrovni, A. ; Danilkin, S. ; Fuess, H. ; Jadrowski, E. ; Neova-Baeva, M. ; Wieder, Thomas :
Effect of Cr content on the crystal structure and lattice dynamics of FCCFe-Cr-Ni-N austenitic alloys.
In: Journal of alloys and compounds, 291 pp. 262-268.
[Artikel], (1999)

Wieder, Thomas :
Numerical Hankel transform by the Fortran program HANKEL.
In: Transactions on mathematical software, 25 pp. 240-250.
[Artikel], (1999)

Wieder, Thomas :
Rietveld-Analyse amorpher Strukturen.
In: Deutsche Gesellschaft für Kristallographie / Arbeitskreis Nicht-kristalline und partiellkristalline Strukturen: Tagung <20, 1999, Wolfersdorf, Jena>; Tagungsbd. .
[Konferenz- oder Workshop-Beitrag], (1999)

Wieder, Thomas ; Neubrand, A. ; Fuess, H. ; Pirling, T. :
Yield stress increase in a W/Cu composite observed by neutron diffraction.
In: Journal of materials science letters, 18 pp. 1135-1137.
[Artikel], (1999)

Wieder, Thomas :
A generalized Debye scattering formula and the Hankel transform.
In: Zeitschrift für Naturforschung. Sect. A: Journal of physical sciences, A 54 pp. 124-130.
[Artikel], (1999)

Danilkin, S. ; Fuess, H. ; Wieder, Thomas ; Wipf, H. :
X-ray and neutron scattering study of Nb-O solid solutions.
In: Journal of alloys and compounds. 266 (1998), S. 230-233
[Artikel], (1998)

Wieder, Thomas ; Fuess, Hartmut :
On the generalized Debye scattering equation.
In: EPDIC 5. Materials Science Forum, 278-28. Schweiz Parma , pp. 100-105.
[Buchkapitel], (1998)

Wieder, Thomas ; Fuess, H. :
A generalized Debye scattering equation.
In: Zeitschrift für Naturforschung. 52 a (1997), S. 386-392
[Artikel], (1997)

Wieder, Thomas :
Realstrukturaufklärung polykristalliner dünner Schichten mittels Röntgenbeugung.
Technische Univ. Darmstadt , Darmstadt
[Habilitation], (1996)

Wieder, Thomas :
Simultaneous determination of the strain/stress tensor and the un-strained lattice constants by X-ray diffraction.
In: Applied physics letters. 69 (1996)
[Artikel], (1996)

Wieder, Thomas :
WVM: a computer program for the determination of lattice constants and strains in thin films.
In: Computer physics communications. 96 (1996), S. 53-60
[Artikel], (1996)

Wieder, Thomas :
Calculation of thermally induced strains in thin films of any crystal class.
[Online-Edition: http://dx.doi.org/10.1063/1.360273]
In: Journal of Applied Physics, 78 (2) pp. 838-841. ISSN 00218979
[Artikel], (1995)

Zendehroud, Jafar ; Wieder, Thomas ; Klein, Helmut :
Determination of Stress Tensors in thin textured copper films by grazing incidence diffraction.
[Online-Edition: http://dx.doi.org/10.1002/mawe.19950261012]
In: Materialwissenschaft und Werkstofftechnik, 26 (10) pp. 553-559. ISSN 09335137
[Artikel], (1995)

Zendehroud, Jafar ; Wieder, Thomas ; Thoma, Klaus :
Gitterkonstantenbestimmung in kubischen dünnen Schichten unter thermischer Dehnung.
[Online-Edition: http://dx.doi.org/10.1002/mawe.19950260712]
In: Materialwissenschaft und Werkstofftechnik, 26 (7) pp. 386-393. ISSN 09335137
[Artikel], (1995)

Wieder, Thomas :
Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strain.
[Online-Edition: http://dx.doi.org/10.1016/0040-6090(94)06309-5]
In: Thin Solid Films, 256 (1-2) pp. 39-43. ISSN 00406090
[Artikel], (1995)

Wieder, Thomas :
SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions.
[Online-Edition: http://dx.doi.org/10.1016/0010-4655(94)00128-O]
In: Computer Physics Communications, 85 (3) pp. 398-414. ISSN 00104655
[Artikel], (1995)

Kimmel, Giora ; Politi, L. ; Wieder, Thomas :
Characterization of (Ti,Al)N Films by XRD and XRF.
In: Advances of X-Ray Analysis, 37 pp. 175-183.
[Artikel], (1994)

Levin, Igor ; Kaplan, Wanye David ; Wieder, Thomas ; Brandon, David :
Residual stresses in alumina-SiC nanocomposites.
[Online-Edition: http://dx.doi.org/10.1016/0956-7151(94)90131-7]
In: Acta Metallurgica et Materialia, 42 (4) pp. 1147-1154. ISSN 09567151
[Artikel], (1994)

Wieder, Thomas :
SBGBBG: A Computer Program For Strain/Stress Tensor Calculation From X-Ray Diffraction Data.
In: Powder Diffraction, 8 pp. 214-215.
[Artikel], (1993)

Zendehroud, Jafar ; Wieder, Thomas :
Tiefenauflösende röntgenographische Dehnungsmessungen an TiN-Schichten in Seemann-Bohlin-Geometrie.
In: Härterei-Technische Mitteilungen, 48 pp. 41-49.
[Artikel], (1993)

Wieder, Thomas :
Berechnung des (420)-Reflexprofiles einer γ′-Fe4N(1−x)-Schicht mit Säulenstruktur und Dehnungsrelaxation.
[Online-Edition: http://dx.doi.org/10.1002/mawe.19910220106]
In: Materialwissenschaft und Werkstofftechnik, 22 (1) pp. 23-30. ISSN 09335137
[Artikel], (1991)

Gartner, Helmut ; Thoma, Klaus ; Volkmann, H ; Wieder, Thomas ; Schmitt, A. :
High-energy implantation of Kr+ into Ti.
[Online-Edition: http://dx.doi.org/10.1016/1359-0189(91)90334-E]
In: International Journal of Radiation Applications and Instrumentation Part D Nuclear Tracks and Radiation Measurements, 19 (1-4) pp. 885-890. ISSN 13590189
[Artikel], (1991)

Siejkowski,, Waldemar ; Calderero-Lopez, A: ; Wieder, Thomas ; Gärtner, Helmut :
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films.
In: Metalurgia I Odlewnictwo, 17 pp. 427-434.
[Artikel], (1991)

Wieder, Thomas ; Herr, W. ; Gärtner, Helmut :
Berechnung von Röntgenreflexen für polykristallines Titan unter dem Einfluß von Stickstoffgradienten und Eigenspannungen.
[Online-Edition: http://dx.doi.org/10.1002/mawe.19890200805]
In: Materialwissenschaft und Werkstofftechnik, 20 (8) pp. 271-277. ISSN 09335137
[Artikel], (1989)

Wieder, Thomas ; Thoma, Klaus ; Gärtner, Helmut :
New scattering formula for the analysis of X-ray line broadening by composition profiles.
[Online-Edition: http://dx.doi.org/10.1007/BF00939259]
In: Applied Physics A Solids and Surfaces, 46 (3) p. 165. ISSN 09478396
[Artikel], (1988)

THOMA, Klaus ; Färber, R. ; Wieder, Thomas ; Gärtner, Helmut :
Structure and fatigue properties of ion-plated Nickel films on steel.
[Online-Edition: http://dx.doi.org/10.1016/0025-5416(87)90228-X]
In: Materials Science and Engineering, 90 pp. 327-332. ISSN 00255416
[Artikel], (1987)

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