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Number of items: 47.

Wieder, Thomas (2014):
A toy model for hostility between two populations in dependency on their internal frustration.
In: International Mathematical Forum, Hikari Ltd., pp. 1581-1593, 9, (32), ISSN 1314-7536,
[Online-Edition: http://www.m-hikari.com/imf.html],
[Article]

Wieder, Thomas (2013):
On the use of strategies attached to subpopulations in the description of competition among different populations.
In: International Mathematical Forum, HIKARI Ltd, pp. 1839-1851, 8, (37), [Online-Edition: http://www.m-hikari.com/],
[Article]

Wieder, Thomas (2012):
Addendum to "A simple differential equation system for the description of competition among religions”.
In: International Mathematical Forum, Hikari Ltd, pp. 2681-2686, 7, (54), ISSN 1312-7594,
[Online-Edition: http://www.m-hikari.com/imf.html],
[Article]

Wieder, Thomas (2012):
The Debye scattering formula in n dimensions.
In: Journal of Mathematical and Computational Science, SCIK, pp. 1086-1090, 2, (4), ISSN 1927-5307,
[Online-Edition: http://scik.org/index.php/jmcs/],
[Article]

Wieder, Thomas (2011):
Generation of all possible multiselections from a multiset.
In: Progress in Applied Mathematics, CSCanada, pp. 61-66, 2, (1), ISSN 1925-2528,
[Online-Edition: http://www.cscanada.net/index.php/pam/index],
[Article]

Wieder, Thomas (2011):
A simple differential equation system for the description of competition among religions.
In: International Mathematical Forum, HIKARI, pp. 1713-1723, 6, [Online-Edition: http://www.m-hikari.com/index.html],
[Article]

Wieder, Thomas (2009):
The number of certain rankings and hierarchies formed from labeled or unlabeled elements and sets.
In: Applied matheamtical sciences, HIKARI, pp. 2707-2724, 3, (55), [Online-Edition: http://www.m-hikari.com/ams/index.html],
[Article]

Wieder, Thomas (2008):
The number of certain k-combinations of an n-set.
In: Applied Mathematical E-Notes, Department of Mathematics, Tsing Hua University, Hsinchu, Taiwan, pp. 45-52, 8, ISSN ISSN 1607-2510,
[Online-Edition: http://www.math.nthu.edu.tw/~amen/],
[Article]

Wali, Y. and Njeh, Anouar and Wieder, Thomas and Ben Ghozlen, M. H. (2007):
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, ELSEVIER, pp. 545-551, 40, (7), ISSN 0963-8695,
[Online-Edition: http://dx.doi.org/10.1016/j.ndteint.2007.02.004],
[Article]

Njeh, Anouar and Wieder, Thomas and Ben Ghozlen, M. H. and Fuess, Hartmut (2004):
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, pp. 135-143, 52, [Article]

Hohl, Achim and Wieder, Thomas and Aken, Peter A. van and Weirich, Th. E. and Denninger, G. and Vidal, M. and Oswald, S. and Deneke, C. and Mayer, J. and Fuess, Hartmut (2003):
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO).
In: Journal of non-crystalline solids, pp. 255-280, 320, [Article]

Schubert, Ulrich and Wieder, Thomas
Schubert, Ulrich and Jutzi, Peter (eds.) (2003):
Ein Strukturmodell des amorphen SiO.
In: Silicon Chemistry, Weinheim, Wiley-VCH, [Book Section]

Hoelzel, Markus and Danilkin, S. A. and Hoser, A. and Ehrenberg, Helmut and Wieder, Thomas and Fuess, Hartmut (2002):
Phonon dispersion in austenitic stainless steel Fe-18Cr-12Ni-2Mo.
In: Applied physics / A, pp. 1013-1015, 74, [Article]

Njeh, Anouar and Wieder, Thomas and Fuess, Hartmut (2002):
Reflectometry studies of the oxidation kinetics of thin copper films.
In: Surface and interface analysis, pp. 626-628, 33, [Article]

Njeh, Anouar and Wieder, Thomas and Schneider, D. and Fuess, Hartmut and Ben Ghozlen, M. H. (2002):
Surface wave propagation in thin silver films under residual stress.
In: Zeitschrift für Naturforschung / A, pp. 58-64, 57, [Article]

Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H. (2001):
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
In: Journal of crystal growth, pp. 625-629, 227-22, [Article]

Schreiber, Jürgen and Neubrand, Achim and Wieder, Thomas and Schamsutdinov, Nail (2001):
Distribution of Macro- and Micro-Stresses in W-CuFGM.
In: Functionally Graded Materials 2000, pp. 603-610, 114, ISSN 1042- 1122,
[Article]

Danilkin, S. A. and Fuess, Hartmut and Wieder, Thomas and Hoser, A. (2001):
Phonon dispersion and elastic constants in Fe-Cr-Mn-Ni austenitic steel;.
In: Journal of Materials Science, pp. 811-814, 36, (4), ISSN 00222461,
[Online-Edition: http://dx.doi.org/10.1023/A:1004801823614],
[Article]

Njeh, Anouar and Wieder, Thomas and Fuess, H. (2000):
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
In: Powder diffraction, pp. 211-216, 15, [Article]

Sigmund, Jochen and Saglam, M. and Vogt, Alexander and Hartnagel, H. L. and Buschmann, V. and Wieder, Thomas and Fuess, H. (2000):
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts.
In: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275, [Conference or Workshop Item]

Wieder, Thomas (2000):
On the strain-free lattice constants in residual stress evaluation by diffraction.
In: Journal of structural geology, pp. 1601-1607, 22, [Article]

Beskrovni, A. and Danilkin, S. and Fuess, H. and Jadrowski, E. and Neova-Baeva, M. and Wieder, Thomas (1999):
Effect of Cr content on the crystal structure and lattice dynamics of FCCFe-Cr-Ni-N austenitic alloys.
In: Journal of alloys and compounds, pp. 262-268, 291, [Article]

Wieder, Thomas (1999):
Numerical Hankel transform by the Fortran program HANKEL.
In: Transactions on mathematical software, pp. 240-250, 25, [Article]

Wieder, Thomas (1999):
Rietveld-Analyse amorpher Strukturen.
In: Deutsche Gesellschaft für Kristallographie / Arbeitskreis Nicht-kristalline und partiellkristalline Strukturen: Tagung <20, 1999, Wolfersdorf, Jena>; Tagungsbd., [Conference or Workshop Item]

Wieder, Thomas and Neubrand, A. and Fuess, H. and Pirling, T. (1999):
Yield stress increase in a W/Cu composite observed by neutron diffraction.
In: Journal of materials science letters, pp. 1135-1137, 18, [Article]

Wieder, Thomas (1999):
A generalized Debye scattering formula and the Hankel transform.
In: Zeitschrift für Naturforschung. Sect. A: Journal of physical sciences, pp. 124-130, A 54, [Article]

Danilkin, S. and Fuess, H. and Wieder, Thomas and Wipf, H. (1998):
X-ray and neutron scattering study of Nb-O solid solutions.
In: Journal of alloys and compounds. 266 (1998), S. 230-233, [Article]

Wieder, Thomas and Fuess, Hartmut (1998):
On the generalized Debye scattering equation.
In: EPDIC 5, Schweiz, pp. 100-105, [Book Section]

Wieder, Thomas and Fuess, H. (1997):
A generalized Debye scattering equation.
In: Zeitschrift für Naturforschung. 52 a (1997), S. 386-392, [Article]

Wieder, Thomas (1996):
Realstrukturaufklärung polykristalliner dünner Schichten mittels Röntgenbeugung.
Darmstadt: 1996. XI, 389 S.,
Darmstadt, Technische Univ. Darmstadt, [Habilitation]

Wieder, Thomas (1996):
Simultaneous determination of the strain/stress tensor and the un-strained lattice constants by X-ray diffraction.
In: Applied physics letters. 69 (1996), [Article]

Wieder, Thomas (1996):
WVM: a computer program for the determination of lattice constants and strains in thin films.
In: Computer physics communications. 96 (1996), S. 53-60, [Article]

Wieder, Thomas (1995):
Calculation of thermally induced strains in thin films of any crystal class.
In: Journal of Applied Physics, pp. 838-841, 78, (2), ISSN 00218979,
[Online-Edition: http://dx.doi.org/10.1063/1.360273],
[Article]

Zendehroud, Jafar and Wieder, Thomas and Klein, Helmut (1995):
Determination of Stress Tensors in thin textured copper films by grazing incidence diffraction.
In: Materialwissenschaft und Werkstofftechnik, pp. 553-559, 26, (10), ISSN 09335137,
[Online-Edition: http://dx.doi.org/10.1002/mawe.19950261012],
[Article]

Zendehroud, Jafar and Wieder, Thomas and Thoma, Klaus (1995):
Gitterkonstantenbestimmung in kubischen dünnen Schichten unter thermischer Dehnung.
In: Materialwissenschaft und Werkstofftechnik, pp. 386-393, 26, (7), ISSN 09335137,
[Online-Edition: http://dx.doi.org/10.1002/mawe.19950260712],
[Article]

Wieder, Thomas (1995):
Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strain.
In: Thin Solid Films, pp. 39-43, 256, (1-2), ISSN 00406090,
[Online-Edition: http://dx.doi.org/10.1016/0040-6090(94)06309-5],
[Article]

Wieder, Thomas (1995):
SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions.
In: Computer Physics Communications, pp. 398-414, 85, (3), ISSN 00104655,
[Online-Edition: http://dx.doi.org/10.1016/0010-4655(94)00128-O],
[Article]

Kimmel, Giora and Politi, L. and Wieder, Thomas (1994):
Characterization of (Ti,Al)N Films by XRD and XRF.
In: Advances of X-Ray Analysis, pp. 175-183, 37, [Article]

Levin, Igor and Kaplan, Wayne David and Wieder, Thomas and Brandon, David (1994):
Residual stresses in alumina-SiC nanocomposites.
In: Acta Metallurgica et Materialia, pp. 1147-1154, 42, (4), ISSN 09567151,
[Online-Edition: http://dx.doi.org/10.1016/0956-7151(94)90131-7],
[Article]

Wieder, Thomas (1993):
SBGBBG: A Computer Program For Strain/Stress Tensor Calculation From X-Ray Diffraction Data.
In: Powder Diffraction, pp. 214-215, 8, [Article]

Zendehroud, Jafar and Wieder, Thomas (1993):
Tiefenauflösende röntgenographische Dehnungsmessungen an TiN-Schichten in Seemann-Bohlin-Geometrie.
In: Härterei-Technische Mitteilungen, pp. 41-49, 48, [Article]

Wieder, Thomas (1991):
Berechnung des (420)-Reflexprofiles einer γ′-Fe4N(1−x)-Schicht mit Säulenstruktur und Dehnungsrelaxation.
In: Materialwissenschaft und Werkstofftechnik, pp. 23-30, 22, (1), ISSN 09335137,
[Online-Edition: http://dx.doi.org/10.1002/mawe.19910220106],
[Article]

Gartner, Helmut and Thoma, Klaus and Volkmann, H. and Wieder, Thomas and Schmitt, A. (1991):
High-energy implantation of Kr+ into Ti.
In: International Journal of Radiation Applications and Instrumentation Part D Nuclear Tracks and Radiation Measurements, pp. 885-890, 19, (1-4), ISSN 13590189,
[Online-Edition: http://dx.doi.org/10.1016/1359-0189(91)90334-E],
[Article]

Siejkowski,, Waldemar and Calderero-Lopez, A: and Wieder, Thomas and Gärtner, Helmut (1991):
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films.
In: Metalurgia I Odlewnictwo, pp. 427-434, 17, [Article]

Wieder, Thomas and Herr, W. and Gärtner, Helmut (1989):
Berechnung von Röntgenreflexen für polykristallines Titan unter dem Einfluß von Stickstoffgradienten und Eigenspannungen.
In: Materialwissenschaft und Werkstofftechnik, pp. 271-277, 20, (8), ISSN 09335137,
[Online-Edition: http://dx.doi.org/10.1002/mawe.19890200805],
[Article]

Wieder, Thomas and Thoma, Klaus and Gärtner, Helmut (1988):
New scattering formula for the analysis of X-ray line broadening by composition profiles.
In: Applied Physics A Solids and Surfaces, p. 165, 46, (3), ISSN 09478396,
[Online-Edition: http://dx.doi.org/10.1007/BF00939259],
[Article]

Thoma, Klaus and Färber, R. and Wieder, Thomas and Gärtner, Helmut (1987):
Structure and fatigue properties of ion-plated Nickel films on steel.
In: Materials Science and Engineering, pp. 327-332, 90, ISSN 00255416,
[Online-Edition: http://dx.doi.org/10.1016/0025-5416(87)90228-X],
[Article]

This list was generated on Tue Jul 16 02:03:21 2019 CEST.