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Number of items: 4.

Siejkowski,, Waldemar and Calderero-Lopez, A: and Wieder, Thomas and Gärtner, Helmut (1991):
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films.
17, In: Metalurgia I Odlewnictwo, pp. 427-434, [Article]

Wieder, Thomas and Herr, W. and Gärtner, Helmut (1989):
Berechnung von Röntgenreflexen für polykristallines Titan unter dem Einfluß von Stickstoffgradienten und Eigenspannungen.
20, In: Materialwissenschaft und Werkstofftechnik, (8), pp. 271-277, ISSN 09335137, [Online-Edition: http://dx.doi.org/10.1002/mawe.19890200805],

Wieder, Thomas and Thoma, Klaus and Gärtner, Helmut (1988):
New scattering formula for the analysis of X-ray line broadening by composition profiles.
46, In: Applied Physics A Solids and Surfaces, (3), p. 165, ISSN 09478396, [Online-Edition: http://dx.doi.org/10.1007/BF00939259],

Thoma, Klaus and Färber, R. and Wieder, Thomas and Gärtner, Helmut (1987):
Structure and fatigue properties of ion-plated Nickel films on steel.
90, In: Materials Science and Engineering, pp. 327-332, ISSN 00255416, [Online-Edition: http://dx.doi.org/10.1016/0025-5416(87)90228-X],

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