Ensling, D. ; Cherkashinin, G. ; Schmid, S. ; Bhuvaneswari, S. ; Thissen, A. ; Jaegermann, W. (2014)
Nonrigid Band Behavior of the Electronic Structure of LiCoO2 Thin Film during Electrochemical Li Deintercalation.
In: Chemistry of Materials, 26 (13)
doi: 10.1021/cm501480b
Artikel, Bibliographie

Klein, Andreas ; Mayer, T. ; Thissen, A. ; Jaegermann, W. (2008)
Photoelectron Spectroscopy in Materials Science and Physical Chemistry: Analysis of Composition, Chemical Bonding, and Electronic Structure of Surfaces and Interfaces.
In: Bunsen-Magazin, 10
doi: 10.1002/9783527636839.ch15
Artikel, Bibliographie

Wu, Q.-H. ; Thissen, A. ; Jaegermann, W. ; Schüz, M. ; Schmidt, P. C. (2006)
Resonant photoemission spectroscopy study of electronic structure of V2O5.
In: Chemical Physics Letters, 430 (4-6)
doi: 10.1016/j.cplett.2006.08.071
Artikel, Bibliographie

Donsanti, F. ; Kostourou, K. ; Decker, F. ; Ibris, N. ; Salvi, A. M. ; Liberatore, M. ; Thissen, A. ; Jaegermann, W. ; Lincot, D. (2006)
Alkali ion intercalation in V2O5: Preparation and laboratory characterization of thin films produced by ALD.
In: Surface and Interface Analysis, 38 (4)
doi: 10.1002/sia.2237
Artikel, Bibliographie

Zhou, Y. ; Yan, X. ; Kroke, E. ; Riedel, R. ; Probst, D. ; Thissen, A. ; Hauser, R. ; Ahles, M. ; Seggern, H. von (2006)
Deposition Temperature Effect on the Structure and Optical Property of RF-PACVD-Derived Hydrogenated SiCNO Film.
In: Materialwissenschaft und Werkstofftechnik, 37 (2)
doi: 10.1002/mawe.200600993
Artikel, Bibliographie

Zhou, Y. ; Yan, X. ; Kroke, E. ; Riedel, R. ; Probst, D. ; Thissen, A. ; Hauser, R. ; Ahles, Marcus ; Seggern, Heinz von (2006)
Deposition temperature effect on the structure and optical property of RF-PACVD-derived hydrogenated.
In: Materialwissenschaft und Werkstofftechnik, 37
Artikel, Bibliographie

Zhou, Y. ; Probst, D. ; Thissen, A. ; Kroke, E. ; Riedel, R. ; Hauser, R. ; Hoche, H. ; Bfroszeit, E. ; Kroll, P. ; Stafast, H. (2006)
Hard Silicon carbonitride films obtained by RF-plasma-enhanced chemical yapour deposition using the single-source precursor bis(trimethylsilyl)carbodiimide.
In: Journal of the European Ceramic Society, 26
Artikel, Bibliographie

Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. (2004)
Deposition of the layered semiconductor SnS2 onto H-terminated Si(111) surfaces: Failure of van der Waals epitaxy and possible implications.
In: Surface Science, 572 (2-3)
doi: 10.1016/j.susc.2004.09.030
Artikel, Bibliographie

Liu, G. ; Klein, Andreas ; Thissen, A. ; Jaegermann, W. (2003)
Electronic properties and interface characterization of phthalocyanine and Ru-polypyridine dyes on TiO2 surface.
In: Surface Science, 539 (1-3)
doi: 10.1016/S0039-6028(03)00721-0
Artikel, Bibliographie

Kraft, D. ; Weiler, U. ; Tomm, Y. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. (2003)
Alternative back contacts for CdTe solar cells: a photoemission study of the VSe2/CdTe and TiSe2/CdTe interface formation.
In: Thin Solid Films, 431-432
doi: 10.1016/S0040-6090(03)00254-2
Artikel, Bibliographie

Kraft, D. ; Thissen, A. ; Broetz, J. ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, W. (2003)
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces.
In: Journal of Applied Physics, 94 (5)
doi: 10.1063/1.1597757
Artikel, Bibliographie

Fritsche, R. ; Wisotzki, E. ; Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. ; Rudolph, R. ; Tonti, D. ; Pettenkofer, C. (2002)
Electronic passivation of Si(111) by Ga–Se half-sheet termination.
In: Applied Physics Letters, 80 (8)
doi: 10.1063/1.1454228
Artikel, Bibliographie