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Number of items: 12.

Ensling, D. ; Cherkashinin, G. ; Schmid, S. ; Bhuvaneswari, S. ; Thissen, A. ; Jaegermann, W. (2014):
Nonrigid Band Behavior of the Electronic Structure of LiCoO2 Thin Film during Electrochemical Li Deintercalation.
In: Chemistry of Materials, 26 (13), pp. 3948-3956. ACS Publications, ISSN 0897-4756,
[Article]

Klein, Andreas ; Mayer, T. ; Thissen, A. ; Jaegermann, W. (2008):
Photoelectron Spectroscopy in Materials Science and Physical Chemistry: Analysis of Composition, Chemical Bonding, and Electronic Structure of Surfaces and Interfaces.
In: Bunsen-Magazin, 10, pp. 124-139. ISSN 0005-9021,
[Article]

Wu, Q.-H. ; Thissen, A. ; Jaegermann, W. ; Schüz, M. ; Schmidt, P. C. (2006):
Resonant photoemission spectroscopy study of electronic structure of V2O5.
In: Chemical Physics Letters, 430 (4-6), pp. 309-313. ISSN 00092614,
[Article]

Donsanti, F. ; Kostourou, K. ; Decker, F. ; Ibris, N. ; Salvi, A. M. ; Liberatore, M. ; Thissen, A. ; Jaegermann, W. ; Lincot, D. (2006):
Alkali ion intercalation in V2O5: Preparation and laboratory characterization of thin films produced by ALD.
In: Surface and Interface Analysis, 38 (4), pp. 815-818. ISSN 0142-2421,
[Article]

Zhou, Y. ; Yan, X. ; Kroke, E. ; Riedel, R. ; Probst, D. ; Thissen, A. ; Hauser, R. ; Ahles, M. ; von Seggern, H. (2006):
Deposition Temperature Effect on the Structure and Optical Property of RF-PACVD-Derived Hydrogenated SiCNO Film.
In: Materialwissenschaft und Werkstofftechnik, 37 (2), pp. 173-177. Wiley-VCH Verlag GmbH, Weinheim, ISSN 0933-5137,
DOI: 10.1002/mawe.200600993,
[Article]

Zhou, Y. ; Yan, X. ; Kroke, E. ; Riedel, R. ; Probst, D. ; Thissen, A. ; Hauser, R. ; Ahles, Marcus ; von Seggern, Heinz (2006):
Deposition temperature effect on the structure and optical property of RF-PACVD-derived hydrogenated.
In: Materialwissenschaft und Werkstofftechnik, 37, p. 173. [Article]

Zhou, Y. ; Probst, D. ; Thissen, A. ; Kroke, E. ; Riedel, R. ; Hauser, R. ; Hoche, H. ; Bfroszeit, E. ; Kroll, P. ; Stafast, H. (2006):
Hard Silicon carbonitride films obtained by RF-plasma-enhanced chemical yapour deposition using the single-source precursor bis(trimethylsilyl)carbodiimide.
In: Journal of the European Ceramic Society, 26, pp. 1325-1335. [Article]

Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. (2004):
Deposition of the layered semiconductor SnS2 onto H-terminated Si(111) surfaces: Failure of van der Waals epitaxy and possible implications.
In: Surface Science, 572 (2-3), pp. 476-482. ISSN 00396028,
[Article]

Liu, G. ; Klein, Andreas ; Thissen, A. ; Jaegermann, W. (2003):
Electronic properties and interface characterization of phthalocyanine and Ru-polypyridine dyes on TiO2 surface.
In: Surface Science, 539 (1-3), pp. 37-48. ISSN 00396028,
[Article]

Kraft, D. ; Weiler, U. ; Tomm, Y. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. (2003):
Alternative back contacts for CdTe solar cells: a photoemission study of the VSe2/CdTe and TiSe2/CdTe interface formation.
In: Thin Solid Films, 431-432, pp. 382-386. ISSN 00406090,
[Article]

Kraft, D. ; Thissen, A. ; Broetz, J. ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, W. (2003):
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces.
In: Journal of Applied Physics, 94 (5), pp. 3589-3598. AIP, ISSN 00218979,
[Article]

Fritsche, R. ; Wisotzki, E. ; Islam, A. B. M. O. ; Thissen, A. ; Klein, Andreas ; Jaegermann, W. ; Rudolph, R. ; Tonti, D. ; Pettenkofer, C. (2002):
Electronic passivation of Si(111) by Ga–Se half-sheet termination.
In: Applied Physics Letters, 80 (8), pp. 1388-1390. ISSN 00036951,
[Article]

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