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Number of items: 4.

Kraft, D. ; Thissen, A. ; Broetz, Joachim ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, Wolfram (2021):
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces. (Publisher's Version)
In: Journal of Applied Physics, 94 (5), pp. 3589-3598. AIP Publishing, ISSN 0021-8979, e-ISSN 1089-7550,
DOI: 10.26083/tuprints-00019908,
[Article]

Schulmeyer, T. ; Fritsche, J. ; Thißen, A. ; Klein, Andreas ; Jaegermann, W. ; Campo, M. ; Beier, J. (2003):
Effect of in situ UHV CdCl2-activation on the electronic properties of CdTe thin film solar cells.
In: Thin Solid Films, 431-432, pp. 84-89. ISSN 00406090,
[Article]

Kraft, D. ; Thissen, A. ; Broetz, J. ; Flege, S. ; Campo, M. ; Klein, Andreas ; Jaegermann, W. (2003):
Characterization of tellurium layers for back contact formation on close to technology treated CdTe surfaces.
In: Journal of Applied Physics, 94 (5), pp. 3589-3598. AIP, ISSN 00218979,
[Article]

Kraft, D. ; Thiβen, A. ; Campo, M. ; Beerbom, M. ; Mayer, T. ; Klein, Andreas ; Jaegermann, W. (2001):
Electronic Properties of Chemically Etched CdTe Thin Films: Role of Te for Back-Contact Formation.
In: MRS Proceedings, 668, pp. H7.5. ISSN 1946-4274,
[Article]

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