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Number of items: 11.

Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Oxford, Pergamon, In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, [Conference or Workshop Item]

Schüßler, M. and Mottet, B. and Sydlo, C. and Krozer, V. and Hartnagel, H. L. and Jakoby, Rolf (2000):
Model for the Decrease in HBT Collector Current under DC Stress based on Recombination Enhanced Defect Reactions.
Dresden, Germany, In: 11th ESREF-Symposium, [Conference or Workshop Item]

Schüßler, Martin and Mottet, B. and Sydlo, C. and Krozer, V. and Hartnagel, H. L. and Jakoby, Rolf (2000):
Model for the decrease in HBT collector current under DC stress based on recombination enhanced defect reactions.
Oxford, Pergamon, In: ESREF 2000: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <11, 2000, Dresden>: Proceedings. S. 1733-1738. - Oxford: Pergamon, 2000, [Conference or Workshop Item]

Grajal, J. and Lin, C. I. and Gonzalez, P. and Krozer, V. (1999):
Optimization of doping profiles in Schottky diodes for millimeter frequency multipliers.
In: International Conference Terahertz Electronics <7, 1999, Nara, Japan>: IEEE Proceedings, [Conference or Workshop Item]

Dehe, A. and Beilenhoff, K. and Fricke, A. and Klingbeil, Harald and Krozer, V. and Hartnagel, H. L. (1999):
Microwave measurement.
In: J. G. Webster, editor, The Measurement, Instrumentation and Sensors Handbook, chapter 55.1-55.5. CRC Press, Boca Raton, [Article]

Grajal, J. and Krozer, V. and Maldonado, F. and Gonzalez, E. and Lin, C. I. and Hartnagel, H. L. (1998):
Tripler circuit design with Schottky varactors.
In: International Conference Terahertz Electronics <6,1998, Leeds, UK>: Proceedings. S. 153-156, [Conference or Workshop Item]

Grajal, J. and Krozer, V. and Schüßler, M. and Brandt, M. and Hartnagel, Hans L. (1997):
Application of semiconductor interface modelling to reliability characterisation.
In: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings, [Conference or Workshop Item]

Grajal, J. and Krozer, V. and Gonzalez, P. and Gismero, J. and Maldonado, F. and Lin, C. I. and Simon, A. and Hartnagel, H. L. (1997):
Characterization of Schottky diode performance by numerical simulation coupled with harmonic balance.
In: European Microwave Conference <27, 1997, Jerusalem>: Proceedings, [Conference or Workshop Item]

Lin, Chih-I. and Krozer, V. and Grajal, and Simon, A. and Hartnagel, H. L. (1997):
Schottky varactor diode optimation for frequency multipliers.
In: International Workshop on Terahertz Electronics <5, 1997, Grenoble>: Proceedings, [Conference or Workshop Item]

Sigurdardottir, Anna and Krozer, V. and Hartnagel, H. L. (1995):
Modeling and design of InAs/AlSb-resonant tunneling diodes.
In: Applied physics letters. 67 (1995), No. 22, S. 3313-3315, [Article]

Grajal, J. and Krozer, V. and Hartnagel, H. L. and Gismero, J. (1995):
Simulation of the influence of interface states on HBTs.
In: Workshop on Compound Semiconductor Devices and Integrated Circuits: WOCSDICE 95 <19, 1995, Stockholm, Schweden>: Abstracts, [Conference or Workshop Item]

This list was generated on Tue Oct 22 00:58:23 2019 CEST.