Sydlo, Cezary ; Mottet, B. ; Ganis, H. ; Hartnagel, H. L. ; Krozer, V. ; Delage, S. L. ; Cassette, S. ; Chartier, E. ; Floriot, D. (2001)
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Konferenzveröffentlichung, Bibliographie

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000)
Model for the Decrease in HBT Collector Current under DC Stress based on Recombination Enhanced Defect Reactions.
11th ESREF-Symposium.
Konferenzveröffentlichung, Bibliographie

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000)
Model for the decrease in HBT collector current under DC stress based on recombination enhanced defect reactions.
Konferenzveröffentlichung, Bibliographie

Grajal, J. ; Lin, C. I. ; Gonzalez, P. ; Krozer, V. (1999)
Optimization of doping profiles in Schottky diodes for millimeter frequency multipliers.
Konferenzveröffentlichung, Bibliographie

Dehe, A. ; Beilenhoff, K. ; Fricke, A. ; Klingbeil, Harald ; Krozer, V. ; Hartnagel, H. L. (1999)
Microwave measurement.
In: J. G. Webster, editor, The Measurement, Instrumentation and Sensors Handbook, chapter 55.1-55.5. CRC Press, Boca Raton
Artikel, Bibliographie

Grajal, J. ; Krozer, V. ; Maldonado, F. ; Gonzalez, E. ; Lin, C. I. ; Hartnagel, H. L. (1998)
Tripler circuit design with Schottky varactors.
Konferenzveröffentlichung, Bibliographie

Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Konferenzveröffentlichung, Bibliographie

Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L. (1997)
Application of semiconductor interface modelling to reliability characterisation.
Konferenzveröffentlichung, Bibliographie

Grajal, J. ; Krozer, V. ; Gonzalez, P. ; Gismero, J. ; Maldonado, F. ; Lin, C. I. ; Simon, A. ; Hartnagel, H. L. (1997)
Characterization of Schottky diode performance by numerical simulation coupled with harmonic balance.
Konferenzveröffentlichung, Bibliographie

Lin, Chih-I. ; Krozer, V. ; Grajal, J. ; Simon, A. ; Hartnagel, H. L. (1997)
Schottky varactor diode optimation for frequency multipliers.
Konferenzveröffentlichung, Bibliographie

Brandt, Michael ; Schüßler, M. ; Krozer, V. ; Grajal, J. ; Hartnagel, H. L. (1997)
Transmission line pulse based reliability investigations of HBTs.
Konferenzveröffentlichung, Bibliographie

Schuessler, M. ; Statzner, T. ; Lin, C. I. ; Krozer, V. ; Horn, J. ; Hartnagel, Hans L. (1996)
Electrochemical deposition of Pd, Ti, and Ge for applications in GaAs technology.
In: Journal of The Electrochemical Society, 143 (4)
doi: 10.1149/1.1836604
Artikel, Bibliographie

Dehé, Alfons ; Klingbeil, H. ; Krozer, V. ; Fricke, K. ; Beilenhoff, K. ; Hartnagel, H. L.
Hrsg.: Ranson, Richard G. (1996)
GaAs monolithic integrated microwave power sensor in coplanar waveguide technology.
IEEE MTT-S International Microwave Symposium. San Francisco, Calif. (June 17 - 21, 1996)
Konferenzveröffentlichung, Bibliographie

Schuessler, M. ; Krozer, V. ; Bock, K. H. ; Brandt, M. ; Vecchi, L. ; Losi, R. ; Hartnagel, Hans L. (1996)
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability, 36 (11-12)
doi: 10.1016/0026-2714(96)00226-0
Artikel, Bibliographie

Fricke, K. ; Krozer, V. ; Schüßler, M. (1996)
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
3rd International High Temperature Electronics Conference. Albuquerque, NM, USA (09.06.1996-14.06.1996)
Konferenzveröffentlichung, Bibliographie

Dehé, A. ; Krozer, V. ; Fricke, K. ; Klingbeil, H. ; Beilenhoff, K. ; Hartnagel, H. L. (1995)
Integrated microwave power sensor.
In: Electronic letters, 31 (25)
doi: 10.1049/el:19951506
Artikel, Bibliographie

Pantoja, J. M. M. ; Grüb, Andreas ; Krozer, V. ; Franco, J. L. S. (1995)
Accuracy of nonoscillating one-port noise measurements.
In: IEEE Transactions on Instrumentation and Measurement, 44 (4)
doi: 10.1109/19.392870
Artikel, Bibliographie

Sigurdardottir, Anna ; Krozer, V. ; Hartnagel, H. L. (1995)
Modeling and design of InAs/AlSb-resonant tunneling diodes.
In: Applied physics letters. 67 (1995), No. 22, S. 3313-3315
Artikel, Bibliographie

Grajal, J. ; Krozer, V. ; Hartnagel, H. L. ; Gismero, J. (1995)
Simulation of the influence of interface states on HBTs.
Konferenzveröffentlichung, Bibliographie

Grüb, Andreas ; Simon, A. ; Krozer, V. ; Lin, C.-I. ; Shaalan, M. ; Beilenhoff, K. ; Sigurdardottir, A. ; Hartnagel, H. L. (1995)
Terahertz research at TH Darmstadt.
Third International Workshop on Terahertz Electronics. Zermatt, Schweiz (Aug. 30-31, 1995)
Konferenzveröffentlichung, Bibliographie

Fricke, Klaus ; Krozer, V. ; Hartnagel, L. (1995)
Theromdynamics of microwave devices.
In: Handbook of microwave technology
Buchkapitel, Bibliographie