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Group by: No Grouping | Item Type | Date | Language
Number of items: 11.

Sydlo, Cezary ; Mottet, B. ; Ganis, H. ; Hartnagel, H. L. ; Krozer, V. ; Delage, S. L. ; Cassette, S. ; Chartier, E. ; Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, Oxford, Pergamon, [Conference or Workshop Item]

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000):
Model for the Decrease in HBT Collector Current under DC Stress based on Recombination Enhanced Defect Reactions.
Dresden, Germany, 11th ESREF-Symposium, [Conference or Workshop Item]

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000):
Model for the decrease in HBT collector current under DC stress based on recombination enhanced defect reactions.
In: ESREF 2000: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <11, 2000, Dresden>: Proceedings. S. 1733-1738. - Oxford: Pergamon, 2000, Oxford, Pergamon, [Conference or Workshop Item]

Grajal, J. ; Lin, C. I. ; Gonzalez, P. ; Krozer, V. (1999):
Optimization of doping profiles in Schottky diodes for millimeter frequency multipliers.
In: International Conference Terahertz Electronics <7, 1999, Nara, Japan>: IEEE Proceedings, [Conference or Workshop Item]

Dehe, A. ; Beilenhoff, K. ; Fricke, A. ; Klingbeil, Harald ; Krozer, V. ; Hartnagel, H. L. (1999):
Microwave measurement.
In: J. G. Webster, editor, The Measurement, Instrumentation and Sensors Handbook, chapter 55.1-55.5. CRC Press, Boca Raton, [Article]

Grajal, J. ; Krozer, V. ; Maldonado, F. ; Gonzalez, E. ; Lin, C. I. ; Hartnagel, H. L. (1998):
Tripler circuit design with Schottky varactors.
In: International Conference Terahertz Electronics <6,1998, Leeds, UK>: Proceedings. S. 153-156, [Conference or Workshop Item]

Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L. (1997):
Application of semiconductor interface modelling to reliability characterisation.
In: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings, [Conference or Workshop Item]

Grajal, J. ; Krozer, V. ; Gonzalez, P. ; Gismero, J. ; Maldonado, F. ; Lin, C. I. ; Simon, A. ; Hartnagel, H. L. (1997):
Characterization of Schottky diode performance by numerical simulation coupled with harmonic balance.
In: European Microwave Conference <27, 1997, Jerusalem>: Proceedings, [Conference or Workshop Item]

Lin, Chih-I. ; Krozer, V. ; Grajal, ; Simon, A. ; Hartnagel, H. L. (1997):
Schottky varactor diode optimation for frequency multipliers.
In: International Workshop on Terahertz Electronics <5, 1997, Grenoble>: Proceedings, [Conference or Workshop Item]

Sigurdardottir, Anna ; Krozer, V. ; Hartnagel, H. L. (1995):
Modeling and design of InAs/AlSb-resonant tunneling diodes.
In: Applied physics letters. 67 (1995), No. 22, S. 3313-3315, [Article]

Grajal, J. ; Krozer, V. ; Hartnagel, H. L. ; Gismero, J. (1995):
Simulation of the influence of interface states on HBTs.
In: Workshop on Compound Semiconductor Devices and Integrated Circuits: WOCSDICE 95 <19, 1995, Stockholm, Schweden>: Abstracts, [Conference or Workshop Item]

This list was generated on Sat Jan 22 03:17:18 2022 CET.