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Comparison of MESFET, HEMT, and HBT device performance at high temperatures

Fricke, K. and Krozer, and Schüßler, (1996):
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
In: High - Temperature Electronics Conference <1996, Albuquerque, NM, USA>: Proceedings, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Fricke, K. and Krozer, and Schüßler,
Title: Comparison of MESFET, HEMT, and HBT device performance at high temperatures
Language: English
Series Name: High - Temperature Electronics Conference <1996, Albuquerque, NM, USA>: Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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