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Pulsed stress reliability investigations of Schottky diodes and HBTs

Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

Item Type: Article
Erschienen: 1996
Creators: Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L.
Title: Pulsed stress reliability investigations of Schottky diodes and HBTs
Language: English
Journal or Publication Title: Microelectronics and reliability. 36 (1996), S. 1907-1910
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:23
License: [undefiniert]
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