Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]
Item Type: | Article |
---|---|
Erschienen: | 1996 |
Creators: | Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. |
Title: | Pulsed stress reliability investigations of Schottky diodes and HBTs |
Language: | English |
Journal or Publication Title: | Microelectronics and reliability. 36 (1996), S. 1907-1910 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
Date Deposited: | 19 Nov 2008 16:23 |
License: | [undefiniert] |
Export: | |
Suche nach Titel in: | TUfind oder in Google |
![]() |
Send an inquiry |
Options (only for editors)
![]() |
Show editorial Details |