Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. |
| Title: | Pulsed stress reliability investigations of Schottky diodes and HBTs |
| Language: | English |
| Journal or Publication Title: | Microelectronics and reliability. 36 (1996), S. 1907-1910 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:23 |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum