Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, Oxford, Pergamon, [Conference or Workshop Item]
Item Type: | Conference or Workshop Item |
---|---|
Erschienen: | 2001 |
Creators: | Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. |
Title: | Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT |
Language: | English |
Series Name: | ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001 |
Place of Publication: | Oxford |
Publisher: | Pergamon |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
Date Deposited: | 19 Nov 2008 16:28 |
Additional Information: | Best Paper Award |
License: | [undefiniert] |
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