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Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT

Sydlo, Cezary ; Mottet, B. ; Ganis, H. ; Hartnagel, H. L. ; Krozer, V. ; Delage, S. L. ; Cassette, S. ; Chartier, E. ; Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, Oxford, Pergamon, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2001
Creators: Sydlo, Cezary ; Mottet, B. ; Ganis, H. ; Hartnagel, H. L. ; Krozer, V. ; Delage, S. L. ; Cassette, S. ; Chartier, E. ; Floriot, D.
Title: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT
Language: English
Series Name: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001
Place of Publication: Oxford
Publisher: Pergamon
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:28
Additional Information:

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