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Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT

Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Oxford, Pergamon, In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2001
Creators: Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D.
Title: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT
Language: English
Series Name: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001
Place of Publication: Oxford
Publisher: Pergamon
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:28
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