Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, Oxford, Pergamon, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2001 |
| Creators: | Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. |
| Title: | Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT |
| Language: | English |
| Series Name: | ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001 |
| Place of Publication: | Oxford |
| Publisher: | Pergamon |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:28 |
| Additional Information: | Best Paper Award |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
View Item |
Drucken
Impressum