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Application of semiconductor interface modelling to reliability characterisation

Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L. (1997):
Application of semiconductor interface modelling to reliability characterisation.
In: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L.
Title: Application of semiconductor interface modelling to reliability characterisation
Language: English
Series Name: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:22
License: [undefiniert]
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