Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Konferenzveröffentlichung, Bibliographie

Brandt, Michael ; Schüßler, M. ; Parmeggiani, E. ; Lin, C. ; Simon, A. ; Hartnagel, H. L. (1997)
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00134-0
Artikel, Bibliographie