Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Oxford, Pergamon, In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, [Conference or Workshop Item]