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Number of items: 12.

Buschmann, Veronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1999)
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructures.
In: Journal of applied physics, 85
Article, Bibliographie

Buschmann, Véronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1998)
Hetero-epitaxial growth of CoSi2 thin films on Si(100): template effects and epitaxial orientations.
In: Journal of crystal growth. 191 (1998), S. 430-438
Article, Bibliographie

Vogt, Alexander ; Simon, A. ; Hartnagel, H. L. ; Schikora, J. ; Buschmann, V. ; Rodewald, M. ; Fuess, H. ; Fascko, S. ; Koerdt, C. ; Kurz, H. (1998)
Ohmic contact formation mechanics of the PdGeAu system on n-type GaSb grown by molecular beam epitaxy.
In: Journal of Applied Physics, 83 (12)
Article, Bibliographie

Vogt, Alexander ; Simon, A. ; Hartnagel, H. L. ; Schikora, J. ; Buschmann, V. ; Rodewald, M. ; Fuess, H. ; Fascko, S. ; Kurz, H. (1998)
Ohmsche Kontakte des Systems Pd/Ge/Au auf n-GaSb.
Conference or Workshop Item, Bibliographie

Vogt, A. ; Brandt, M. ; Sigurdardottir, A. ; Schüssler, M. ; Pena, D. ; Simon, A. ; Hartnagel, H. L. ; Rodewald, M. ; Roesner, M. ; Fuess, H. ; Goswami, S. N. N. ; Lal, K. (1997)
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00141-8
Article, Bibliographie

Neubeck, K. ; Rodewald, M. ; Riemenschneider, R. ; Rück, D. M. ; Baumann, H. ; Hahn, H. ; Balogh, Adam G. (1997)
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation.
In: Materials Science Forum Vol. 248-249
Article, Bibliographie

Brecht, E. ; Fromknecht, R. ; Geerk, J. ; Meyer, O. ; Rodewald, M. ; Schneider, R. ; Linker, G. (1997)
The [113] growth direction of Yba2Cu3O7-x thin films.
In: Solid State Communications, 102
Article, Bibliographie

Neubeck, K. ; Rodewald, M. ; Riemenschneider, R. ; Rück, D. M. ; Baumann, H. ; Hahn, Horst ; Balogh, Adam G. (1997)
Characterisation of Cu/Al2O3 interfaces after heavy ion irradiation.
In: Materials Science Forum, 248/249
doi: 10.4028/www.scientific.net/MSF.248-249.125
Article, Bibliographie

Vogt, Alexander ; Hartnagel, Hans L. ; Rodewald, M. ; Fuess, H. ; Ressel, P. ; Vogel, K. ; Würfl, J. (1997)
Pd-based Ohmic contacts to GaSb.
21st Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE'97). Scheveningen, The Netherlands (May 25-28, 1997)
Conference or Workshop Item, Bibliographie

Rodewald, M. ; Rodewald, K. ; Meulenaere, Paul de ; van Tendeloo, G. (1997)
Real-space characterization of short-range order in Cu-Pd alloys.
In: Physical Review B, 55
Article, Bibliographie

Nitsche, Robert ; Rodewald, M. ; Skandan, G. ; Fuess, H. ; Hahn, H. (1996)
HRTEM study of nanocrystalline zirconia powders.
In: Nanostructured materials, 7 (5)
Article, Bibliographie

Steinborn, T. ; Adrian, H. ; Brecht, E. ; Fuess, H. ; Maul, M. ; Miehe, G. ; Petersen, K. ; Rodewald, M. ; Rao, M. ; Schmahl, W. W. ; Traeholt, C. ; Wiesner, J. ; Wirth, G. ; Zandbergen, H. ; Zegenhagen, J. (1996)
Orientational changes in the a-b plane of YBa2Cu3O7-beta films on different substrates.
In: Journal of applied crystallography, 29 (2)
doi: 10.1107/S0021889895011289
Article, Bibliographie

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