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High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc.
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Steinborn, T. ; Adrian, H. ; Brecht, E. ; Fuess, H. ; Maul, M. ; Miehe, G. ; Petersen, K. ; Rodewald, M. ; Rao, M. ; Schmahl, W. W. ; Traeholt, C. ; Wiesner, J. ; Wirth, G. ; Zandbergen, H. ; Zegenhagen, J. (1996)
Orientational changes in the a-b plane of YBa2Cu3O7-beta films on different substrates.
In: Journal of applied crystallography, 29 (2)
doi: 10.1107/S0021889895011289
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