Buschmann, Veronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1999)
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructures.
In: Journal of applied physics, 85
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Buschmann, Véronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1998)
Hetero-epitaxial growth of CoSi2 thin films on Si(100): template effects and epitaxial orientations.
In: Journal of crystal growth. 191 (1998), S. 430-438
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Schäffer, C. (1996)
Growth of epitaxial CoSi2 films on strained Si1-xGex/Si(001) heterostructures.
In: Journal of crystal growth. 165 (1996), S. 61-69
Artikel, Bibliographie