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Number of items: 7.

Buschmann, Veronique and Rodewald, M. and Fuess, H. and van Tendeloo, G. and Schäffer, C. (1999):
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructures.
In: Journal of applied physics, pp. 2119-2123, 85, [Article]

Buschmann, Véronique and Rodewald, M. and Fuess, H. and van Tendeloo, G. and Schäffer, C. (1998):
Hetero-epitaxial growth of CoSi2 thin films on Si(100): template effects and epitaxial orientations.
In: Journal of crystal growth. 191 (1998), S. 430-438, [Article]

Vogt, Alexander and Simon, A. and Hartnagel, H. L. and Schikora, J. and Buschmann, V. and Rodewald, M. and Fuess, H. and Fascko, S. and Koerdt, C. and Kurz, H. (1998):
Ohmic contact formation mechanics of the PdGeAu system on n-type GaSb grown by molecular beam epitaxy.
In: Journal of Applied Physics, American Institute of Physics, pp. 7715-7719, 83, (12), ISSN 0021-8979,
[Article]

Vogt, Alexander and Simon, A. and Hartnagel, H. L. and Schikora, J. and Buschmann, V. and Rodewald, M. and Fuess, H. and Fascko, S. and Kurz, H. (1998):
Ohmsche Kontakte des Systems Pd/Ge/Au auf n-GaSb.
In: Jahrestagung Deutsche Gesellschaft für Kristallographie <6, 1998, Karlsruhe>: Tagungsbd., [Conference or Workshop Item]

Neubeck, K. and Rodewald, M. and Riemenschneider, R. and Rück, D. M. and Baumann, H. and Hahn, H. and Balogh, Adam G. (1997):
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation.
In: Materials Science Forum Vol. 248-249, p. 125, [Article]

Rodewald, M. and Rodewald, and De Meulenaere, and van Tendeloo, G. (1997):
Real-space characterization of short-range order in Cu-Pd alloys.
In: Physical review. B 55 (1997), S. 1473-1481, [Article]

Nitsche, Robert and Rodewald, M. and Skandan, G. and Fuess, H. and Hahn, H. (1996):
HRTEM study of nanocrystalline zirconia powders.
In: Nanostructured materials, Elsevier, pp. 535-546, 7, (5), ISSN 0965-9773,
[Article]

This list was generated on Tue Jun 18 01:38:49 2019 CEST.