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Characterisation of degradation mechanisms in resonant tunnelling diodes

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüssler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability. 37 (1997), S. 1691-1694, [Article]

Item Type: Article
Erschienen: 1997
Creators: Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüssler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner,
Title: Characterisation of degradation mechanisms in resonant tunnelling diodes
Language: English
Journal or Publication Title: Microelectronics and reliability. 37 (1997), S. 1691-1694
Divisions: 11 Department of Materials and Earth Sciences
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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